LEADER 02478nam 2200565Ia 450 001 9910702353003321 005 20121211085343.0 035 $a(CKB)5470000002426628 035 $a(OCoLC)820812624 035 $a(EXLCZ)995470000002426628 100 $a20121211d2012 ua 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aOptical and scanning electron microscopy of the Materials International Space Station Experiment (MISSE) spacecraft silicone experiment$b[electronic resource] /$fChing-cheh Hung and Kim K. de Groh, Bruce A. Banks 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$d[2012] 215 $a1 online resource (65 pages) $cillustrations (some color) 225 1 $aNASA/TM ;$v2012-217678 300 $aTitle from title screen (viewed on Dec. 10, 2012). 300 $a"August 2012." 300 $a"Prepared for the 10th International Space Conference on Protection of Materials and Structures From the Space Environment (ICPMSE-10J) cosponsored by ITL, MDA, CSA, JAXA, Kobe University Graduate School of Engineering, and the Society for Promotion of Space Science, Bankoku-Shinryokan, Okinawa, Japan, June 12-17, 2011." 320 $aIncludes bibliographical references (pages 9-10). 517 $aOptical and scanning electron microscopy of the Materials International Space Station Experiment 606 $aLow Earth orbits$2nasat 606 $aCarbon dioxide$2nasat 606 $aSilicones$2nasat 606 $aDegradation$2nasat 606 $aImage analysis$2nasat 606 $aSilicon dioxide$2nasat 606 $aSpaceborne experiments$2nasat 615 7$aLow Earth orbits. 615 7$aCarbon dioxide. 615 7$aSilicones. 615 7$aDegradation. 615 7$aImage analysis. 615 7$aSilicon dioxide. 615 7$aSpaceborne experiments. 700 $aHung$b Ching-cheh$01387319 701 $aDe Groh$b Kim K$01390436 701 $aBanks$b Bruce A$01390437 712 02$aNASA Glenn Research Center. 712 12$aICPMSE (Conference)$d(10th :$f2011 :$eOkinawa-shi, Japan) 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910702353003321 996 $aOptical and scanning electron microscopy of the Materials International Space Station Experiment (MISSE) spacecraft silicone experiment$93443116 997 $aUNINA LEADER 02942nam 22005895 450 001 9910789071903321 005 20200702044841.0 010 $a1-4612-0711-8 024 7 $a10.1007/978-1-4612-0711-5 035 $a(CKB)3390000000040618 035 $a(SSID)ssj0001067857 035 $a(PQKBManifestationID)11600980 035 $a(PQKBTitleCode)TC0001067857 035 $a(PQKBWorkID)11093852 035 $a(PQKB)10184058 035 $a(DE-He213)978-1-4612-0711-5 035 $a(MiAaPQ)EBC3074637 035 $a(PPN)238006980 035 $a(EXLCZ)993390000000040618 100 $a20131120d1996 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt 182 $cc 183 $acr 200 12$aA Probabilistic Theory of Pattern Recognition$b[electronic resource] /$fby Luc Devroye, Laszlo Györfi, Gabor Lugosi 205 $a1st ed. 1996. 210 1$aNew York, NY :$cSpringer New York :$cImprint: Springer,$d1996. 215 $a1 online resource (XV, 638 p.) 225 1 $aStochastic Modelling and Applied Probability,$x0172-4568 ;$v31 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-387-94618-7 311 $a1-4612-6877-X 320 $aIncludes bibliographical references and indexes. 330 $aPattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material. 410 0$aStochastic Modelling and Applied Probability,$x0172-4568 ;$v31 606 $aProbabilities 606 $aPattern recognition 606 $aProbability Theory and Stochastic Processes$3https://scigraph.springernature.com/ontologies/product-market-codes/M27004 606 $aPattern Recognition$3https://scigraph.springernature.com/ontologies/product-market-codes/I2203X 615 0$aProbabilities. 615 0$aPattern recognition. 615 14$aProbability Theory and Stochastic Processes. 615 24$aPattern Recognition. 676 $a519.2 700 $aDevroye$b Luc$4aut$4http://id.loc.gov/vocabulary/relators/aut$060985 702 $aGyörfi$b Laszlo$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aLugosi$b Gabor$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910789071903321 996 $aA Probabilistic Theory of Pattern Recognition$93823071 997 $aUNINA