LEADER 01011nam a2200277 i 4500 001 991000817989707536 005 20020507173955.0 008 960626s1977 ||| ||| | eng 035 $ab10761421-39ule_inst 035 $aLE01302777$9ExL 040 $aDip.to Matematica$beng 082 0 $a515.64 084 $aAMS 34-XX 084 $aAMS 49-01 084 $aAMS 49-XX 100 1 $aElsgolts, Lev Ernestovic$0346159 245 10$aDifferential equations and the calculus of variations /$cL. Elsgolts ; translated from the russian by George Yankovsky 260 $aMoscow :$bMIR,$c1977 300 $a440 p. ;$c23 cm. 650 4$aCalculus of variations 907 $a.b10761421$b21-09-06$c28-06-02 912 $a991000817989707536 945 $aLE013 49-XX ELS11 (1977)$g1$i2013000052182$lle013$o-$pE0.00$q-$rl$s- $t0$u2$v0$w2$x0$y.i10856699$z28-06-02 996 $aDifferential equations and the calculus of variations$9348859 997 $aUNISALENTO 998 $ale013$b01-01-96$cm$da $e-$feng$gxx $h0$i1 LEADER 02945oam 2200637I 450 001 9910788729203321 005 20200520144314.0 010 $a0-429-14069-X 010 $a1-4200-8202-7 024 7 $a10.1201/b10415 035 $a(CKB)3390000000000075 035 $a(EBL)665647 035 $a(OCoLC)703152969 035 $a(SSID)ssj0000469837 035 $a(PQKBManifestationID)11280850 035 $a(PQKBTitleCode)TC0000469837 035 $a(PQKBWorkID)10531690 035 $a(PQKB)10002995 035 $a(MiAaPQ)EBC665647 035 $a(Au-PeEL)EBL665647 035 $a(CaPaEBR)ebr10447928 035 $a(PPN)156181711 035 $a(EXLCZ)993390000000000075 100 $a20180331d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHandbook of surface and nanometrology /$fDavid J. Whitehouse 205 $a2nd ed. 210 1$aBoca Raton :$cCRC Press,$d2011. 215 $a1 online resource (982 p.) 300 $aRev. ed. of: Handbook of surface metrology. c1994. 300 $aA Taylor & Francis book. 311 $a1-322-61470-9 311 $a1-4200-8201-9 320 $aIncludes bibliographical references and index. 327 $aFront cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover 330 $aDavid Whitehouse, known as the father of digital metrology, helped pioneer the use of nanotechnology in surface science and surface metrology, and he continues to move the field forward. In this heavily revised and expanded edition, he addresses the many paradigm shifts occurring in the field. He explains the incorporation of physics to develop optimum solutions for manufacture and performance, and provides mechanical engineers with accessible explanations of essential concepts along with the higher mathematics that is now required of those working in the field. Emphasis is placed on systems w 606 $aSurfaces (Technology)$xMeasurement 606 $aNanostructured materials 606 $aMetrology 615 0$aSurfaces (Technology)$xMeasurement. 615 0$aNanostructured materials. 615 0$aMetrology. 676 $a620/.440287 700 $aWhitehouse$b D. J$g(David J.),$0888020 701 $aWhitehouse$b D. J$g(David J.).$0888020 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910788729203321 996 $aHandbook of surface and nanometrology$93861737 997 $aUNINA