LEADER 05360nam 2200661Ia 450 001 9910784635403321 005 20200520144314.0 010 $a1-281-07307-5 010 $a9786611073077 010 $a0-08-051823-0 010 $a1-4175-2668-8 035 $a(CKB)1000000000384755 035 $a(EBL)318291 035 $a(OCoLC)182732156 035 $a(SSID)ssj0000254014 035 $a(PQKBManifestationID)11221055 035 $a(PQKBTitleCode)TC0000254014 035 $a(PQKBWorkID)10206375 035 $a(PQKB)10790314 035 $a(Au-PeEL)EBL318291 035 $a(CaPaEBR)ebr10203589 035 $a(CaONFJC)MIL107307 035 $a(MiAaPQ)EBC318291 035 $a(PPN)26198344X 035 $a(EXLCZ)991000000000384755 100 $a20020218d2002 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aSurfaces and their measurement$b[electronic resource] /$fDavid Whitehouse 210 $aLondon $cHPS$d2002 215 $a1 online resource (425 p.) 300 $aDescription based upon print version of record. 311 $a1-903996-01-5 320 $aIncludes bibliographical references and index. 327 $aFront Cover; Surfaces and their Measurement; Copyright Page; Contents; Foreword; Chapter 1. Introduction; 1.1 General; 1.2 What is surface metrology?; 1.3 Usefulness of surfaces; 1.4 Nature of surfaces; Chapter 2. Identification and separation of surface features; 2.1 Visualization; 2.2 Profiles and roughness - understanding the measurement routine; 2.3 Waviness; 2.4 Implementing the concept of sampling length; 2.5 The shape of the reference line; 2.6 Other methods; 2.7 Filtering and M system; 2.8 Conclusions; Chapter 3. Profile and areal (3D) parameter characterization; 3.1 Specification 327 $a3.2 Classification of parameters for the profile 3.3 Random process analysis; 3.4 Areal (3D) assessment; 3.5 Space frequency functions; 3.6 Comments on digital areal analysis; 3.7 Two-dimensional filtering (areal filtering); 3.8 Fractal surfaces; 3.9 Summary of characterization; Chapter 4. Surface metrology and manufacture; 4.1 Where and when to measure; 4.2 The process and surface finish; 4.3 Process control; 4.4 Relationship between surface metrology and manufacture; 4.5 Force and metrology loops; 4.6 Unit events and auto correlation; 4.7 Use of the power spectrum 327 $a4.8 Application of space frequency functions 4.9 Conclusions; Chapter 5. Function and surface texture; 5.1 Generic approach; 5.2 Some specific examples in tribology; 5.3 Surface models; 5.4 Summary of function; Chapter 6. Surface finish measurement - general; 6.1 Some quick ways of examining the surface; 6.2 Surface finish instrumentation; 6.3 Comments; Chapter 7. Stylus instruments; 7.1 The stylus; 7.2 Reference; 7.3 Use of skids; 7.4 Pick-up systems; 7.5 Stylus damage; 7.6 Stylus instrument usage; Chapter 8. Optical methods; 8.1 Optical path length; 8.2 Optical penetration 327 $a8.3 Resolution and depth of focus 8.4 Comparison between optical and stylus methods; 8.5 Gloss meters; 8.6 Total integrating sphere; 8.7 Diffractometer; 8.8 Interferometry; 8.9 Optical followers; 8.10 Heterodyne method; 8.11 Other optical methods; 8.12 Conclusions from the comparison of tactile and optical methods; Chapter 9. Scanning microscopes; 9.1 General; 9.2 Scanning microscopes; 9.3 Operation of the STM; 9.4 The atomic force microscope; 9.5 Scanning microscopes: conclusions; 9.6 Instruments 'horns of metrology' : conclusions; Chapter 10. Errors of form (excluding axes of rotation) 327 $a10.1 General statement 10.2 Straightness and related topics; 10.3 Measurement; 10.4 Assessment and classification of straightness; 10.5 Flatness; 10.6 Conclusions; Chapter 11. Roundness and related subjects; 11.1 General; 11.2 Direction of measurement; 11.3 Display of roundness; 11.4 Lobing; 11.5 Methods of measuring roundness; 11.6 Nature of the roundness signal; 11.7 Assessment of roundness; 11.8 Partial arc determination; 11.9 Other parameters; 11.10 Filtering for roundness; 11.11 Harmonic problems; 11.12 Alternatives to harmonic analysis; 11.13 Non-roundness parameters; 11.14 Conclusions 327 $aChapter 12. Cylindricity, sphericity 330 $aThe importance of surface metrology has long been acknowledged in manufacturing and mechanical engineering, but has now gained growing recognition in an expanding number of new applications in fields such as semiconductors, electronics and optics. Metrology is the scientific study of measurement, and surface metrology is the study of the measurement of rough surfaces. In this book, Professor David Whitehouse, an internationally acknowledged subject expert, covers the wide range of theory and practice, including the use of new methods of instrumentation.· Written by one of the world's 606 $aSurfaces (Technology)$xMeasurement 606 $aCivil engineering 615 0$aSurfaces (Technology)$xMeasurement. 615 0$aCivil engineering. 676 $a620.110287 676 $a620.44 700 $aWhitehouse$b D. J$g(David J.)$0888020 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910784635403321 996 $aSurfaces and their measurement$93826779 997 $aUNINA