LEADER 02789nam 2200589 450 001 9910784513003321 005 20230331005413.0 010 $a1-280-52324-7 010 $a9786610523245 010 $a0-19-536465-1 035 $a(CKB)1000000000398571 035 $a(EBL)271603 035 $a(OCoLC)466425385 035 $a(SSID)ssj0000298624 035 $a(PQKBManifestationID)11214965 035 $a(PQKBTitleCode)TC0000298624 035 $a(PQKBWorkID)10361091 035 $a(PQKB)11702094 035 $a(MiAaPQ)EBC271603 035 $a(Au-PeEL)EBL271603 035 $a(CaPaEBR)ebr11303221 035 $a(CaONFJC)MIL52324 035 $a(EXLCZ)991000000000398571 100 $a20161129h19881988 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aHigh-resolution transmission electron microscopy and associated techniques /$feditors, Peter R. Buseck, John M. Cowley, Leroy Eyring 210 1$aNew York, New York ;$aOxford, [England] :$cOxford University Press,$d1988. 210 4$dİ1988 215 $a1 online resource (668 p.) 300 $aDescription based upon print version of record. 311 $a0-19-504275-1 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aCONTENTS; RECOMMENDED SYMBOLS, SIGN CONVENTIONS, AND ACRONYMS; CONTRIBUTORS; 1. IMAGING; 2. IMAGING THEORY; 3. ELASTIC SCATTERING OF ELECTRONS BY CRYSTALS; 4. ELASTIC-SCATTERING THEORY; 5. INELASTIC ELECTRON SCATTERING: PART I; 6. INELASTIC ELECTRON SCATTERING: PART II; 7. TECHNIQUES CLOSELY RELATED TO HIGH-RESOLUTION ELECTRON MICROSCOPY; 8. CALCULATION OF DIFFRACTION PATTERNS AND IMAGES FOR FAST ELECTRONS; 9. MINERALOGY; 10. SOLID-STATE CHEMISTRY; 11. MATERIALS SCIENCE: METALS, CERAMICS, AND SEMICONDUCTORS; 12. PRACTICAL HIGH-RESOLUTION ELECTRON MICROSCOPY; 13. SURFACES 327 $a14. HIGHLY DISORDERED MATERIALSINDEX 330 $aProvides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. This book includes discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, and more. 606 $aTransmission electron microscopy 615 0$aTransmission electron microscopy. 676 $a502/.8/25 702 $aBuseck$b Peter 702 $aCowley$b J. M$g(John Maxwell),$f1923- 702 $aEyring$b LeRoy 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910784513003321 996 $aHigh-resolution transmission electron microscopy and associated techniques$93829545 997 $aUNINA