LEADER 03492nam 2200625 450 001 9910450916503321 005 20200520144314.0 010 $a1-58053-710-3 035 $a(CKB)1000000000411870 035 $a(EBL)338742 035 $a(OCoLC)437208186 035 $a(SSID)ssj0000097824 035 $a(PQKBManifestationID)11127412 035 $a(PQKBTitleCode)TC0000097824 035 $a(PQKBWorkID)10120781 035 $a(PQKB)11289708 035 $a(MiAaPQ)EBC338742 035 $a(Au-PeEL)EBL338742 035 $a(CaPaEBR)ebr10221935 035 $a(CaBNVSL)mat09101170 035 $a(IEEE)9101170 035 $a(EXLCZ)991000000000411870 100 $a20200729d2006 uy 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAdvanced production testing of RF, SoC, and SiP devices /$fJoe Kelly, Michael Engelhardt 210 1$aBoston :$cArtech House,$dİ2007. 210 2$a[Piscataqay, New Jersey] :$cIEEE Xplore,$d[2006] 215 $a1 online resource (325 p.) 225 1 $aArtech House microwave library 300 $aDescription based upon print version of record. 311 $a1-58053-709-X 320 $aIncludes bibliographical references and index. 327 $aAdvanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265 327 $aAppendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 330 3 $aFeaturing invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.$cPublisher abstract. 410 0$aArtech House microwave library. 606 $aSystems on a chip$xTesting 606 $aEmbedded computer systems 608 $aElectronic books. 615 0$aSystems on a chip$xTesting. 615 0$aEmbedded computer systems. 676 $a621.3815 700 $aKelly$b Joe$cPh. D.$0962872 701 $aEngelhardt$b M$g(Michael)$0962873 801 0$bCaBNVSL 801 1$bCaBNVSL 801 2$bCaBNVSL 906 $aBOOK 912 $a9910450916503321 996 $aAdvanced production testing of RF, SoC, and SiP devices$92183315 997 $aUNINA LEADER 03160oam 2200709I 450 001 9910783976503321 005 20230617040236.0 010 $a1-134-47239-0 010 $a1-134-47240-4 010 $a1-280-23176-9 010 $a9786610231768 010 $a0-203-39818-1 024 7 $a10.4324/9780203398180 035 $a(CKB)1000000000254376 035 $a(EBL)180786 035 $a(OCoLC)252730292 035 $a(SSID)ssj0001142588 035 $a(PQKBManifestationID)12456846 035 $a(PQKBTitleCode)TC0001142588 035 $a(PQKBWorkID)11098902 035 $a(PQKB)11411608 035 $a(SSID)ssj0000108637 035 $a(PQKBManifestationID)11139149 035 $a(PQKBTitleCode)TC0000108637 035 $a(PQKBWorkID)10044556 035 $a(PQKB)11521378 035 $a(MiAaPQ)EBC180786 035 $a(Au-PeEL)EBL180786 035 $a(CaPaEBR)ebr10163181 035 $a(CaONFJC)MIL23176 035 $a(EXLCZ)991000000000254376 100 $a20180331d2003 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 14$aThe Balkans after the Cold War $efrom tyranny to tragedy /$fTom Gallagher 210 1$aLondon ;$aNew York :$cRoutledge,$d2003. 215 $a1 online resource (258 p.) 225 1 $aOutcast Europe ;$vv. 2 300 $aDescription based upon print version of record. 311 $a0-415-37560-6 311 $a0-415-27763-9 320 $aIncludes bibliographical references (p. [233]-243) and index. 327 $aChallenges and crises after the communist era -- The international dimension of the escalating crisis in Yugoslavia -- The war in Croatia and the countdown to the Bosnian conflict, July 1991-May 1992 -- Genocide and dispossession in Bosnia and the international response -- The Bosnian endgame : survival amidst tragedy and international rancour -- International intervention in the Balkans 1995-7 : limited goals and capabilities -- Authoritarian rule in Serbia, Croatia and Bosnia. 330 $aAt the end of the Cold War, the Balkan states of South East Europe were in crisis. They had emerged from two decades of hardline communism with their economies in disarray and authoritarian leaders poised to whip up nationalist feelings so as to cling on to power. The break up of Yugoslavia followed in 1991 along with prolonged instability in Romania, Bulgaria and Albania. The Balkans After The Cold War analyzes these turbulent events, which led to violence on a scale not seen in Europe for nearly 50 years and offers a detailed critique of Western policy towards the region. This volum 410 0$aOutcast Europe ;$vv. 2. 606 $aYugoslav War, 1991-1995 607 $aYugoslavia$xHistory$y1980-1992 607 $aFormer Yugoslav republics$xHistory 615 0$aYugoslav War, 1991-1995. 676 $a949.703 686 $a15.70$2bcl 700 $aGallagher$b Tom$f1954,$01518591 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910783976503321 996 $aThe Balkans after the Cold War$93756212 997 $aUNINA