LEADER 05585nam 22006734a 450 001 9910783925203321 005 20230617040824.0 010 $a1-281-89868-6 010 $a9786611898687 010 $a981-270-264-4 035 $a(CKB)1000000000334371 035 $a(EBL)296054 035 $a(OCoLC)476063115 035 $a(SSID)ssj0000097747 035 $a(PQKBManifestationID)11133029 035 $a(PQKBTitleCode)TC0000097747 035 $a(PQKBWorkID)10121170 035 $a(PQKB)10409451 035 $a(MiAaPQ)EBC296054 035 $a(WSP)00005574 035 $a(Au-PeEL)EBL296054 035 $a(CaPaEBR)ebr10174114 035 $a(CaONFJC)MIL189868 035 $a(EXLCZ)991000000000334371 100 $a20060907d2004 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aAdvanced mathematical & computational tools in metrology VI$b[electronic resource] /$feditors, P. Ciarlini ... [et al.] 210 $aSingapore ;$aRiver Edge, NJ $cWorld Scientific$dc2004 215 $a1 online resource (367 p.) 225 1 $aSeries on advances in mathematics for applied sciences ;$vv. 66 300 $aPapers from the sixth workshop on the theme of advanced mathematical and computational tools in metrology, held at the Istituto di Metrologia "G. Colonnetti", Torino, Italy, September 2003. 311 $a981-238-904-0 320 $aIncludes bibliographical references and index. 327 $aForeword; Contents; Estimation of Precision and Uncertainty of a Calibration Artefact for CMMs S. D. Antunes and M. A. F. Vicente; Uncertainty in Semi-Qualitative Testing W. Bremser and W. Hasselbarth; Processing the Coherent Anomalies on Digitalized Surfaces in Wavelet Domain P. Ciarlini and M. L. Lo Cascio; Least Squares Adjustment in the Presence of Discrepant Data M. G. Cox, A. B. Forbes, J. L. Flowers and P. M. Harris; Harmonization of Correlated Calibration Curves with an Application to the Analysis of Natural Gases M. G. Cox, S. Kamvissis, M. J. T. Milton and G. Vargha 327 $aParametrized Approximation Estimators for Mixed Noise Distributions D. P. Jenkinson, J. C. Mason, A. Crampton, M. G. Cox, A. B. Forbes and R. BoudjemaaAlgorithms for the Calibration of Laser-Plane Sensors on CMMs C. Lartigue, P. Bourdet, L. Mathieu and C. Mehdi-Souzani; Some Differences between the Applied Statistical Approach for Measurement Uncertainty Theory and the Traditional Approach in Metrology and Testing C. Perruchet; Metrology Software for the Expression of Measurement Results by Direct Calculation of Probability Distributions G. B. Rossi, F. Crenna and M. Codda 327 $aFeasibility Study of Using Bootstrap to Compute the Uncertainty Contribution from Few Repeated Measurements B. R. L. Siebert and P. CiarliniRecursive and Parallel Algorithms for Approximating Surface Data on a Family of Lines or Curves G. Allasia; Process Measurement Impact on the Verification Uncertainty J. Bachmann, J. M. Linares, S. Aranda and J. M. Sprauel; On the In-Use Uncertainty of an Instrument W. Bich and F. Pennecchi; Automatic Differentiation and Its Application in Metrology R. Boudjemaa, M. G. Cox, A. B. Forbes and P. M. Harris 327 $aUsage of Non-Central Probability Distributions for Data Analysis in Metrology A. ChunovkinaImplementation of a General Least Squares Method in Mass Measurements J. Hald and L. Nielsen; The GUM Tree Design Pattern for Uncertainty Software B. D. Hall; Statistical Hypotheses Testing for Phase Transition Identification in Cryogenic Thermometry D. Ichim, I. Peroni and F: Sparasci; The Impact of Entropy Optimization Principles on the Probability Assignment to the Measurement Uncertainty G. Iuculano, A. Zanobini and G. Pellegrini 327 $aStochastic Processes for Modelling and Evaluating Atomic Clock Behaviour G. Panfilo, P. Tavella and C. ZuccaCompound-Modelling of Metrological Data Series F. Pavese; Homotopic Solution of EW-TLS Problems M. L. Rastello and A. Premoli; Pooled Data Distributions: Graphical and Statistical Tools for Examining Comparison Reference Values A. G. Steele, K. D. Hill and R. J. Douglas; Numerical Uncertainty Evaluation for Complex-Valued Quantities: A Case Example L. Callegaro, F. Pennecchi and W. Bich 327 $aBayesian Approach to Quantum State Tomography S. Castelletto, I. P. Degiovanni, M. L. Rastello and I. Ruo Berchera 330 $aThis volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mat 410 0$aSeries on advances in mathematics for applied sciences ;$vv. 66. 606 $aMeasurement$vCongresses 606 $aPhysical measurements$vCongresses 610 1 $aMetrology 615 0$aMeasurement 615 0$aPhysical measurements 676 $a530.8 701 $aCiarlini$b P$0604368 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910783925203321 996 $aAdvanced mathematical & computational tools in metrology VI$93729084 997 $aUNINA