LEADER 06101nam 2200721 450 001 9910783590503321 005 20230109184134.0 010 $a0-19-773261-5 010 $a1-280-44178-X 010 $a0-19-802281-6 010 $a9786610441785 010 $a0-19-534469-3 010 $a1-60256-628-3 035 $a(CKB)1000000000033356 035 $a(StDuBDS)AH24082831 035 $a(SSID)ssj0000365581 035 $a(PQKBManifestationID)12136863 035 $a(PQKBTitleCode)TC0000365581 035 $a(PQKBWorkID)10413671 035 $a(PQKB)10043994 035 $a(SSID)ssj0000241578 035 $a(PQKBManifestationID)12031826 035 $a(PQKBTitleCode)TC0000241578 035 $a(PQKBWorkID)10298017 035 $a(PQKB)11563063 035 $a(OCoLC)228117554 035 $a(Au-PeEL)EBL5567791 035 $a(OCoLC)1061127334 035 $a(MiAaPQ)EBC241662 035 $a(EXLCZ)991000000000033356 100 $a20181122d1994 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aScanning force microscopy $ewith applications to electric, magnetic, and atomic forces /$fDror Sarid 205 $aRev. ed. 210 1$aNew York, New York ;$aOxford, England :$cOxford University Press,$d1994. 215 $a1 online resource (xiii,263p. )$cill 225 1 $aOxford series in optical and imaging sciences 300 $aPrevious ed.: 1991. 311 $a0-19-506270-1 311 $a0-19-509204-X 320 $aIncludes bibliographical references (p. 233-259) and index. 327 $aIntro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary. 327 $aChapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index. 330 $aIncludes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM. 330 $bThis technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. 410 0$aOxford series in optical and imaging sciences. 606 $aScanning force microscopy 606 $aSurfaces (Physics) 615 0$aScanning force microscopy. 615 0$aSurfaces (Physics) 676 $a502.82 700 $aSarid$b Dror$0745994 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910783590503321 996 $aScanning force microscopy$91488437 997 $aUNINA