LEADER 00913nam0-22003011i-450- 001 990004801750403321 005 19990530 035 $a000480175 035 $aFED01000480175 035 $a(Aleph)000480175FED01 035 $a000480175 100 $a19990530g19149999km-y0itay50------ba 101 0 $aita 105 $aa-------00--- 200 1 $aCarmina$fJoannis Pascoli$gCollegit Maria Soror$gediditi H. Pistelli$gexornavit A. De Karolis 210 $aBononiae [i.e. Bologna]$cZanichelli$d1914. 215 $a579 p.$cill.$d29 cm 700 1$aPascoli,$bGiovanni$f<1855-1912>$0152621 702 1$aDe Carolis,$bAdolfo$f<1874-1928> 702 1$aPascoli,$bMaria$f<1865-1953> 702 1$aPistelli,$bErmenegildo 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990004801750403321 952 $a3/XII E 2$bR.Bibl. 5930$fFLFBC 959 $aFLFBC 996 $aCarmina$9561294 997 $aUNINA LEADER 03330nam 2200613Ia 450 001 9910783539503321 005 20230828225729.0 010 $a1-280-54757-X 010 $a9786610547579 010 $a1-84663-011-8 035 $a(CKB)1000000000242843 035 $a(EBL)267393 035 $a(OCoLC)71174790 035 $a(SSID)ssj0000671747 035 $a(PQKBManifestationID)11384635 035 $a(PQKBTitleCode)TC0000671747 035 $a(PQKBWorkID)10625146 035 $a(PQKB)11705436 035 $a(MiAaPQ)EBC267393 035 $a(Au-PeEL)EBL267393 035 $a(CaPaEBR)ebr10132649 035 $a(CaONFJC)MIL54757 035 $a(OCoLC)133162498 035 $a(EXLCZ)991000000000242843 100 $a20000815d2006 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aAdvanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging$b[electronic resource] /$fguest editors Christopher Bailey and Johan Liu 210 $aBradford, England $cEmerald Group Publishing$dc2006 215 $a1 online resource (72 p.) 225 0 $aSoldering & surface mount technology ;$vv.18, no. 2 300 $aDescription based upon print version of record. 311 $a1-84663-010-X 327 $aCover; Contents; Guest editorial; Coffin-Manson constant determination for a Sn-8Zn-3Bi lead-free solder joint; High strain rate testing of solder interconnections; Intermetallic compound formation and diffusion path evolution in eutectic tin-lead flip chip solder bumps after aging; Macro-micro modelling of moisture induced stresses in an ACF flip chip assembly; High performance anisotropic conductive adhesives for lead-free interconnects; Effect of curing conditions on the electrical properties of isotropic conductive adhesives composed of an epoxy-based binder 327 $aFinite element analysis of fleXBGA reliabilityInternet commentary; Book review; New products; Industry news; Exhibitions and conferences; Appointments; International diary 330 $aThis issue of Soldering & Surface Mount Technology (SSMT) presents a number of papers from the 7th High Density Microsystems Design, Packaging and Failure Analysis (HDP'05) conference held in 2005 in the dynamic city of Shanghai, China. With over 100 high quality technical papers and presentation this annual conference brings together scholars and industrialists from Asia, Europe and the Americas to discuss the challenges and latest advances in high density packaging. This e-book contains six papers from the HDP conference, plus one additional contribution, which discuss the behaviour of key i 410 0$aSoldering & surface mount technology ;$vv.18, no. 2. 606 $aManufacturing processes 606 $aElectronic packaging 615 0$aManufacturing processes. 615 0$aElectronic packaging. 676 $a621.381/046 701 $aBailey$b Christopher$01469364 701 $aLiu$b Johan$01469365 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910783539503321 996 $aAdvanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging$93680831 997 $aUNINA