LEADER 05566nam 2200673Ia 450 001 9910782122603321 005 20230617010654.0 010 $a1-281-93459-3 010 $a9786611934590 010 $a981-279-470-0 035 $a(CKB)1000000000537774 035 $a(EBL)1679457 035 $a(OCoLC)879074235 035 $a(SSID)ssj0000232126 035 $a(PQKBManifestationID)11193207 035 $a(PQKBTitleCode)TC0000232126 035 $a(PQKBWorkID)10227110 035 $a(PQKB)11288777 035 $a(MiAaPQ)EBC1679457 035 $a(WSP)00005607 035 $a(Au-PeEL)EBL1679457 035 $a(CaPaEBR)ebr10255983 035 $a(CaONFJC)MIL193459 035 $a(EXLCZ)991000000000537774 100 $a20060316d2004 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aRadiation effects and soft errors in integrated circuits and electronic devices$b[electronic resource] /$feditors, R.D. Schrimpf, D.M. Fleetwood 210 $aSingapore ;$aNew Jersey $cWorld Scientific Pub.$dc2004 215 $a1 online resource (349 p.) 225 1 $aSelected topics in electronics and systems ;$vvol. 34 300 $aAlso published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623. 311 $a981-238-940-7 320 $aIncludes bibliographical references. 327 $aCONTENTS ; Preface ; Single Event Effects in Avionics and on the Ground ; 1. Introduction ; 2. Similarities between SEE in Avionics and on the Ground ; 3. Differences Between SEE in Avionics and on the Ground ; 4. Atmospheric and Ground Level Environments ; 5. SEE Data in devices 327 $a6. Summary Soft Errors in Commercial Integrated Circuits ; 1. Introduction ; 2. Scaling trends for memory devices ; 3. Seating trend for peripheral logic devices ; 4. Conclusion ; Single-Event Effects in lll-V Semiconductor Electronics ; 1. Introduction 327 $a2. Single-Event Effects in lll-V Electronic Devices 3. Summary and Conclusions ; Investigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser ; 1. Basic Mechanisms of a SET ; 2. SET Laser Testing ; 3. Experimental set-up for SET laser testing ; 4. Results 327 $a5. Conclusions System Level Single Event Upset Mitigation Strategies ; 1. Introduction ; 2. Systems Engineering for Energetic Particle Environment Compatibility ; 3. Fault Tolerant Systems Strategies ; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits 327 $a1. Introduction 2. Radiation Mechanisms in Mixed-Signal Integrated Circuits ; 3. Process Component and Layout Choices for Hardened-by-Design Circuits ; 4. Total Dose Hardening ; 5. Single-Event Effect Hardening ; 6. Dose-Rate Effect Hardening ; 7. Conclusion 327 $aA Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits 330 $a This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes t 410 0$aSelected topics in electronics and systems ;$vvol. 34. 606 $aElectronic circuits$xEffect of radiation on 606 $aIntegrated circuits$xEffect of radiation on 615 0$aElectronic circuits$xEffect of radiation on. 615 0$aIntegrated circuits$xEffect of radiation on. 676 $a621.3815 701 $aSchrimpf$b Ronald Donald$01531970 701 $aFleetwood$b D. M$g(Dan M.)$01531971 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910782122603321 996 $aRadiation effects and soft errors in integrated circuits and electronic devices$93777943 997 $aUNINA