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010   $a9786613148186
010   $a1-84816-407-6
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100   $a20110712d2011      uy             0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 10$aSelected semiconductor research$b[electronic resource] /$fMing-Fu Li
210   $aLondon $cImperial College Press$d2011
215   $a1 online resource (529 p.)
300   $aTwo columns to the page.
311   $a1-84816-406-8 
320   $aIncludes bibliographical references.
327   $aPreface; Contents; Introduction; Chapter 1. Defects in Semiconductors; Chapter 2. Semiconductor Band Structures; Chapter 3. Analog Integrated Circuit Design; Chapter 4. CMOS Device Reliability; Chapter 5. CMOS Technology; Chapter 6. Nano CMOS Device Quantum Simulation; Complete List of Publications; Biography
330   $aThis unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of: semiconductor physics and materials, including topics in deep level defects and band structures, CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. This book can be referenced by research scientists, engineers, and graduate students working in the areas of sol
606   $aSemiconductors$xResearch
606   $aNanoelectronics$xResearch
615  0$aSemiconductors$xResearch.
615  0$aNanoelectronics$xResearch.
676   $a621.3815/2
700   $aLi$b Ming-Fu$0772169
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910781211003321
996   $aSelected semiconductor research$93757261
997   $aUNINA