LEADER 05504nam 2200697 a 450 001 9910780808403321 005 20230721025227.0 010 $a1-282-44272-4 010 $a9786612442728 010 $a981-283-952-6 035 $a(CKB)2550000000000207 035 $a(EBL)477087 035 $a(SSID)ssj0000432877 035 $a(PQKBManifestationID)11328181 035 $a(PQKBTitleCode)TC0000432877 035 $a(PQKBWorkID)10374992 035 $a(PQKB)10612768 035 $a(MiAaPQ)EBC477087 035 $a(WSP)00002114 035 $a(Au-PeEL)EBL477087 035 $a(CaPaEBR)ebr10361861 035 $a(CaONFJC)MIL244272 035 $a(OCoLC)887498119 035 $a(EXLCZ)992550000000000207 100 $a20090116d2009 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAdvanced mathematical & computational tools in metrology & testing VIII$b[electronic resource] /$feditors, F. Pavese ... [et al.] 210 $aSingapore ;$aHackensack, NJ $cWorld Scientific$dc2009 215 $a1 online resource (419 p.) 225 1 $aSeries on advances in mathematics for applied sciences ;$vv. 78 300 $aDescription based upon print version of record. 311 $a981-283-951-8 320 $aIncludes bibliographical references and index. 327 $aForeword; Contents; Sensitivity Analysis in Metrology: Study and Comparison on Different Indices for Measurement Uncertainty A Allard and N Fischer; 1. Introduction to Sensitivity Analysis; 2. Sensitivity Analysis Indices; 2.1. Partial Derivative Approach - GUM; 2.2. "One At a Time" Index - GUM S1; 2.3. Rank Correlation; 2.4. Variance Based Method - Sobol Indices; 2.4.1. Definitions; 2.4.2. Estimation; 3. Examples; 3.1. Mass Calibration; 3.2. Ishigami Function; 4. Conclusion; Acknowledgments; References 327 $aLikelihood Maximization Against the Probability Density Function Shape S Aranda, J-M Linares and J-M Sprauel1. Introduction; 2. Statistical Best-Fit Approach; 3. Definition of Probability Density Function (PDF); 4. Definition of the Likelihood Criterion Function; 5. Conclusion; References; Methods for Estimation of the Effect of Correlation at the Measurement of Alternating Voltage T Barashkova; 1. The Research on the Effect of Correlation in the Measurement of Alternating Voltage; 2. Expert Statistical Method; Acknowledgments; References 327 $aMulti-Determination of Aerodynamic Loads Using Calibration Curve with a Polynomial and MLP Neural Network Combination I M Barbosa, O A De Faria Mello, M L Collucci da Costa Reis and E del Moral Hernandez1. Instrumentation; 2. Methodology; 2.1. Fitting by Polynomial Only; 2.2. Fitting by Multilayer Perceptron (MLP) Only; 2.3. Fitting by Combination between Polynomial and MLP; 3. Results; 3.1. The Polynomial Approach; 3.2. The MLP Approach; 3.3. Combination of MLP and Polynomial Approaches; 3.4. Other Indicators for Performance Function; 4. Conclusions; REFERENCES 327 $aUncertainty Analysis in Calibration of Standard Volume Measures E Batista, N Almeida and E Filipe1. Introduction; 2. Uncertainty Evaluation; 2.1. The Measurement Model and Uncertainty Components; 2.2. Combined and Expanded Uncertainty; 3. Experimental Results; 4. Concluding Remarks; References; Virtual Atomic Force Microscope as a Tool for Nanometrology V S Bormashov, A S Baturin, A V Zablotskiy, R V Goldshtein and K B Ustinov; 1. Introduction; 2. "Virtual AFM" Features; 2.1. Scanning system; 2.2. Feedback system; 2.3. Optical registration system; 2.4. Probe-specimen interaction module 327 $a3. ConclusionAcknowledgments; References; Development of a Mathematical Procedure for Modelling and Inspecting Complex Surfaces for Measurement Process S Boukebbab, H Bouchenitfa and J-M Linares; 1. Introduction; 2. Presentation of the Mathematical Procedure; 3. Application for Rapid Prototyping Technology; 4. Conclusion; References; A Software Simulation Tool to Evaluate the Uncertainties for a Lock-in Amplifier P Clarkson, T J Esward, P M Harris, K J Lines, F O Onakunle and I M Smith; 1. Introduction; 2. Principles Of The Lock-in Amplifier; 3. Monte Carlo Calculation 327 $a4. Simulation Software Tool 330 $aThe main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple me 410 0$aSeries on advances in mathematics for applied sciences ;$vv. 78. 606 $aMeasurement$vCongresses 606 $aPhysical measurements$vCongresses 606 $aMetrology$vCongresses 615 0$aMeasurement 615 0$aPhysical measurements 615 0$aMetrology 676 $a530.8 701 $aPavese$b Franco$0898789 712 12$aAMCTM VIII 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910780808403321 996 $aAdvanced mathematical & computational tools in metrology & testing VIII$93701264 997 $aUNINA