LEADER 05340nam 2200673Ia 450 001 9910458110803321 005 20200520144314.0 010 $a1-280-70770-4 010 $a9786610707706 010 $a0-08-046545-5 035 $a(CKB)1000000000364033 035 $a(EBL)281971 035 $a(OCoLC)437175524 035 $a(SSID)ssj0000109111 035 $a(PQKBManifestationID)11138073 035 $a(PQKBTitleCode)TC0000109111 035 $a(PQKBWorkID)10045428 035 $a(PQKB)10514350 035 $a(MiAaPQ)EBC281971 035 $a(CaSebORM)9780123735898 035 $a(Au-PeEL)EBL281971 035 $a(CaPaEBR)ebr10151448 035 $a(CaONFJC)MIL70770 035 $a(EXLCZ)991000000000364033 100 $a20060615d2006 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aBasics of interferometry$b[electronic resource] /$fP. Hariharan 205 $a2nd ed. 210 $aBoston $cElsevier Academic Press$dc2006 215 $a1 online resource (249 p.) 300 $aDescription based upon print version of record. 311 $a1-4933-0100-4 311 $a0-12-373589-0 320 $aIncludes bibliographical references and index. 327 $aFront cover; Title page; Copyright page; Contents; Preface to the First Edition; Preface to the Second Edition; Acknowledgments; 1 Introduction; 2 Interference: A Primer; 2.1 Light Waves; 2.2 Intensity in an Interference Pattern; 2.3 Visibility of Interference Fringes; 2.4 Interference with a Point Source; 2.5 Localization of Fringes; 2.6 Summary; 2.7 Problems; Further Reading; 3 Two-Beam Interferometers; 3.1 Wavefront Division; 3.2 Amplitude Division; 3.3 The Rayleigh Interferometer; 3.4 The Michelson Interferometer; 3.5 The Mach-Zehnder Interferometer; 3.6 The Sagnac Interferometer 327 $a3.7 Summary 3.8 Problems; Further Reading; 4 Source-Size and Spectral Effects; 4.1 Coherence; 4.2 Source-Size Effects; 4.3 Spectral Effects; 4.4 Polarization Effects; 4.5 White-Light Fringes; 4.6 Channeled Spectra; 4.7 Summary; 4.8 Problems; Further Reading; 5 Multiple-Beam Interference; 5.1 Multiple-Beam Fringes by Transmission; 5.2 Multiple-Beam Fringes by Reflection; 5.3 Multiple-Beam Fringes of Equal Thickness; 5.4 Fringes of Equal Chromatic Order (FECO Fringes); 5.5 The Fabry-Perot Interferometer; 5.6 Summary; 5.7 Problems; Further Reading; 6 The Laser as a Light Source 327 $a6.1 Lasers for Interferometry 6.2 Laser Modes; 6.3 Single-Wavelength Operation of Lasers; 6.4 Polarization of Laser Beams; 6.5 Wavelength Stabilization of Lasers; 6.6 Laser-Beam Expansion; 6.7 Problems with Laser Sources; 6.8 Laser Safety; 6.9 Summary; 6.10 Problems; Further Reading; 7 Photodetectors; 7.1 Photomultipliers; 7.2 Photodiodes; 7.3 Charge-Coupled Detector Arrays; 7.4 Photoconductive Detectors; 7.5 Pyroelectric Detectors; 7.6 Summary; 7.7 Problems; Further Reading; 8 Measurements of Length; 8.1 The Definition of the Metre; 8.2 Length Measurements 327 $a8.3 Measurements of Changes in Length 8.4 Summary; 8.5 Problems; Further Reading; 9 Optical Testing; 9.1 The Fizeau Interferometer; 9.2 The Twyman-Green Interferometer; 9.3 Analysis of Wavefront Aberrations; 9.4 Laser Unequal-Path Interferometers; 9.5 The Point-Diffraction Interferometer; 9.6 Shearing Interferometers; 9.7 Grazing-Incidence Interferometry; 9.8 Summary; 9.9 Problems; Further Reading; 10 Digital Techniques; 10.1 Digital Fringe Analysis; 10.2 Digital Phase Measurements; 10.3 Testing Aspheric Surfaces; 10.4 Summary; 10.5 Problems; Further Reading; 11 Macro- and Micro-Interferometry 327 $a11.1 Interferometry of Refractive Index Fields 11.2 The Mach-Zehnder Interferometer; 11.3 Interference Microscopy; 11.4 Multiple-Beam Interferometry; 11.5 Two-Beam Interference Microscopes; 11.6 The Nomarski Interferometer; 11.7 Summary; 11.8 Problems; Further Reading; 12 White-Light Interference Microscopy; 12.1 White-Light Interferometry; 12.2 White-Light Phase-Shifting Microscopy; 12.3 Spectrally Resolved Interferometry; 12.4 Coherence-Probe Microscopy; 12.5 Summary; 12.6 Problems; Further reading; 13 Holographic and Speckle Interferometry; 13.1 Holographic Interferometry 327 $a13.2 Holographic Nondestructive Testing 330 $aOptical interferometry is used in communications, medical imaging, astronomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more concise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in the 606 $aInterferometry 606 $aElectric interference 608 $aElectronic books. 615 0$aInterferometry. 615 0$aElectric interference. 676 $a535/.470287 700 $aHariharan$b P$047552 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910458110803321 996 $aBasics of interferometry$92278547 997 $aUNINA LEADER 02595nam 2200661Ia 450 001 9910780006103321 005 20230823161526.0 010 $a1-280-22175-5 010 $a9786610221752 010 $a0-309-56817-X 035 $a(CKB)111069351106014 035 $a(OCoLC)326717231 035 $a(CaPaEBR)ebrary10071344 035 $a(SSID)ssj0000235285 035 $a(PQKBManifestationID)11176172 035 $a(PQKBTitleCode)TC0000235285 035 $a(PQKBWorkID)10247037 035 $a(PQKB)10457091 035 $a(MiAaPQ)EBC3377319 035 $a(Au-PeEL)EBL3377319 035 $a(CaPaEBR)ebr10071344 035 $a(OCoLC)923269752 035 $a(EXLCZ)99111069351106014 100 $a19861010d1986 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 12$aA relationship restored $etrends in U.S.-China educational exchanges, 1978-1984 /$fDavid M. Lampton with Joyce A. Madancy and Kristen M. Williams for the Committee on Scholarly Communication with the People's Republic of China 210 1$aWashington, D.C. :$cNational Academy Press,$d1986. 215 $a1 online resource (xviii, 266 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 0 $a0-309-03678-X 320 $aIncludes bibliographies and index. 330 $aProvides the attributes of American and Chinese students and scholars who have moved between China and the United States since 1978. 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