LEADER 03615nam 2200661 a 450 001 9910779845403321 005 20200520144314.0 010 $a1-280-20495-8 010 $a9786610204953 010 $a0-306-46914-6 024 7 $a10.1007/b119182 035 $a(CKB)111056485437460 035 $a(EBL)3035362 035 $a(SSID)ssj0000109382 035 $a(PQKBManifestationID)11114006 035 $a(PQKBTitleCode)TC0000109382 035 $a(PQKBWorkID)10047356 035 $a(PQKB)10092705 035 $a(DE-He213)978-0-306-46914-5 035 $a(MiAaPQ)EBC3035362 035 $a(Au-PeEL)EBL3035362 035 $a(CaPaEBR)ebr10046976 035 $a(CaONFJC)MIL20495 035 $a(OCoLC)923695676 035 $a(PPN)237930072 035 $a(EXLCZ)99111056485437460 100 $a19980811d1998 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aBeam effects, surface topography, and depth profiling in surface analysis$b[electronic resource] /$fedited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell 205 $a1st ed. 2002. 210 $aNew York $cPlenum Press$dc1998 215 $a1 online resource (451 p.) 225 1 $aMethods of surface characterization ;$vv. 5 300 $aDescription based upon print version of record. 311 $a0-306-45896-9 320 $aIncludes bibliographical references and index. 327 $aPhoton Beam Damage and Charging at Solid Surfaces -- Electron Beam Damage at Solid Surfaces -- Ion Beam Bombardment Effects on Solid Surfaces at Energies Used for Sputter Depth Profiling -- Characterization of Surface Topography -- Depth Profiling Using Sputtering Methods. 330 $aMany books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior. 410 0$aMethods of surface characterization ;$vv. 5. 606 $aSurfaces (Technology)$xAnalysis 606 $aMaterials$xEffect of radiation on 615 0$aSurfaces (Technology)$xAnalysis. 615 0$aMaterials$xEffect of radiation on. 676 $a620/.44 701 $aCzanderna$b Alvin Warren$f1930-$017992 701 $aMadey$b Theodore E$048976 701 $aPowell$b C. J$g(Cedric John)$01135386 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910779845403321 996 $aBeam effects, surface topography, and depth profiling in surface analysis$93678930 997 $aUNINA