LEADER 03067oam 2200697I 450 001 9910779033403321 005 20230802004959.0 010 $a1-136-59295-4 010 $a0-429-22841-4 010 $a1-283-46196-X 010 $a9786613461964 010 $a1-136-59296-2 010 $a0-203-18243-X 024 7 $a10.4324/9780203182437 035 $a(CKB)2550000000098763 035 $a(EBL)958110 035 $a(OCoLC)798531931 035 $a(SSID)ssj0000644970 035 $a(PQKBManifestationID)11446463 035 $a(PQKBTitleCode)TC0000644970 035 $a(PQKBWorkID)10680317 035 $a(PQKB)10849581 035 $a(MiAaPQ)EBC958110 035 $a(Au-PeEL)EBL958110 035 $a(CaPaEBR)ebr10535179 035 $a(CaONFJC)MIL346196 035 $a(OCoLC)785783660 035 $a(OCoLC)727702637 035 $a(FINmELB)ELB138885 035 $a(EXLCZ)992550000000098763 100 $a20180706d2012 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aBeyond testing $etowards a theory of educational assessment /$fCaroline V. Gipps 205 $aClassic ed. 210 1$aLondon ;$aNew York :$cRoutledge,$d2012. 215 $a1 online resource (177 p.) 225 1 $aRoutledge education classic edition series 300 $aDescription based upon print version of record. 311 $a0-415-68956-2 311 $a0-415-68955-4 320 $aIncludes bibliographical references and index. 327 $aBeyond Testing; Copyright; Contents; Preface; Acknowledgments; Glossary; Chapter 1 Assessment paradigms; Chapter 2 Assessment and learning; Chapter 3 Impact of testing; Chapter 4 Validity and reliability; Chapter 5 Criterion-referenced assessment; Chapter 6 Performance assessment; Chapter 7 Teacher assessment and formative assessment; Chapter 8 Ethics and equity; Chapter 9 A framework for educational assessment; References; Index 330 $a'It is an exceptionally thoughtful assessment of assessment, and I am (along with anyone else who broods about education) much in your debt.' Jerome Bruner, personal communication with the authorWhen this award-winning book was originally published in 1994, a review in the TES said: 'Beyond Testing is a refreshingly honest look at the dilemmas facing those who are trying to make educational assessment more supportive of high-quality learning for all pupils and students ... It contains powerful and practical messages for assessment developers, policy-makers, tea 410 0$aRoutledge education classic edition series. 606 $aEducational tests and measurements 606 $aExaminations$xDesign and construction 615 0$aEducational tests and measurements. 615 0$aExaminations$xDesign and construction. 676 $a371.260973 700 $aGipps$b C. V.$0947948 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910779033403321 996 $aBeyond testing$93862250 997 $aUNINA LEADER 02489nam0 22004333i 450 001 UBO2832726 005 20251003044423.0 010 $a887192231X 010 $a9788871922317 100 $a20080702d2005 ||||0itac50 ba 101 | $aita 102 $ait 181 1$6z01$ai $bxxxe 182 1$6z01$an 200 1 $aCircuiti integrati digitali$el'ottica del progettista$fJan M. Rabaey, Anantha Chandrakasan, Borivoje Nicolic$gedizione italiana a cura di Andrea Cester, Andrea Gerosa 205 $a2. ed 210 $aMilano$cPearson education Italia$d[2005] 215 $aXXIV, 820 p.$cill.$d24 cm. 500 10$aDigital integrated circuits.$3UBO2832746$9UBOV111619$9758558 606 $aCircuiti integrati$xProgettazione$2FIR$3MILC095947$9E 606 $aCircuiti digitali$2FIR$3SBLC000151$9E 676 $a621.39$9INGEGNERIA DEGLI ELABORATORI$v14 676 $a621.395$9INGEGNERIA DEGLI ELABORATORI. CIRCUITERIA$v22 696 $aChip$aCircuiti elettronici integrati 699 $aCircuiti integrati$yChip 699 $aCircuiti integrati$yCircuiti elettronici integrati 700 1$aRabaey$b, Jan M.$3UBOV111619$4070$0286555 701 1$aChandrakasan$b, Anantha$3MILV214983$4070$0286556 701 1$aNikolic$b, Borivoje$3UBOV775430$4070$0422729 702 1$aGerosa$b, Andrea$f <1977- >$3PUVV348431 702 1$aCester$b, Andrea$3UBOV003213 801 3$aIT$bIT-000000$c20080702 850 $aIT-BN0095 901 $bNAP 01$cSALA DING $n$ 912 $aUBO2832726 950 0$aBiblioteca Centralizzata di Ateneo$b1 v. (5. copia)$c1 v. in cinque copie$d 01SALA DING 621.39 RAB.ci$e 0102 0000069205 VMA A4 1 v.$fY $h20080702$i20080702$b1 v. (5. copia)$c1 v. in cinque copie$d 01SALA DING 621.39 RAB.ci$e 0102 0000069215 VMA A4(bis 1 v. (2. copia)$fY $h20080702$i20080702$b1 v. (5. copia)$c1 v. in cinque copie$d 01SALA DING 621.39 RAB.ci$e 0102 0000069225 VMA A4(ter 1 v. (3. copia)$fY $h20080702$i20080702$b1 v. (5. copia)$c1 v. in cinque copie$d 01SALA DING 621.39 RAB.ci$e 0102 0000069235 VMA A4(quater 1 v. (4. copia)$fY $h20080702$i20080702$b1 v. (5. copia)$c1 v. in cinque copie$d 01SALA DING 621.39 RAB.ci$e 0102 0000069245 VMA A4(quinquies 1 v. (5. copia)$fY $h20080702$i20080702 977 $a 01 996 $aDigital integrated circuits$9758558 997 $aUNISANNIO