LEADER 02496nam 2200601Ia 450 001 9910778383303321 005 20230721031747.0 010 $a0-309-18000-7 010 $a1-280-96919-9 010 $a9786610969197 010 $a0-309-11184-6 035 $a(CKB)1000000000479049 035 $a(EBL)3378288 035 $a(SSID)ssj0000106806 035 $a(PQKBManifestationID)11131784 035 $a(PQKBTitleCode)TC0000106806 035 $a(PQKBWorkID)10131957 035 $a(PQKB)11541850 035 $a(MiAaPQ)EBC3378288 035 $a(Au-PeEL)EBL3378288 035 $a(CaPaEBR)ebr10194191 035 $a(CaONFJC)MIL96919 035 $a(OCoLC)923277558 035 $a(EXLCZ)991000000000479049 100 $a20071214d2007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 03$aAn assessment of the National Institute of Standards and Technology Electronics and Electrical Engineering Laboratory$b[electronic resource] $efiscal year 2007 /$fPanel on Electronics and Electrical Engineering, Laboratory Assessments Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies 210 $aWashington, D.C. $cNational Academies Press$dc2007 215 $a1 online resource (39 p.) 300 $aDescription based upon print version of record. 311 $a0-309-11183-8 327 $a""Front Matter ""; ""Contents""; ""Summary""; ""Charge to the Panel and Description of the Assessment Process""; ""Organization of the Laboratory""; ""The Assessment""; ""Additional Concerns of the Panel""; ""Recommended New Directions""; ""Conclusions"" 606 $aElectronics$xStandards$zUnited States 606 $aElectronics$xResearch$zUnited States 606 $aElectrical engineering$xStandards$zUnited States 606 $aElectrical engineering$xResearch$zUnited States 615 0$aElectronics$xStandards 615 0$aElectronics$xResearch 615 0$aElectrical engineering$xStandards 615 0$aElectrical engineering$xResearch 676 $a621.37 712 02$aNational Research Council (U.S.).$bPanel on Electronics and Electrical Engineering. 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910778383303321 996 $aAn assessment of the National Institute of Standards and Technology Electronics and Electrical Engineering Laboratory$93852938 997 $aUNINA