LEADER 03647oam 2200649I 450 001 9910777360903321 005 20230803194244.0 010 $a0-429-17625-2 010 $a1-4822-8934-2 010 $a1-4200-1725-X 010 $a1-282-77797-1 010 $a9786612777974 010 $a0-203-18425-4 024 7 $a10.1201/9781482289343 035 $a(UkCvUL)(CKB)1000000000002452 035 $a(UkCvUL)(EBL)168520 035 $a(UkCvUL)(OCoLC)62589237 035 $a(UkCvUL)(SSID)ssj0000278993 035 $a(UkCvUL)(PQKBManifestationID)11211539 035 $a(UkCvUL)(PQKBTitleCode)TC0000278993 035 $a(UkCvUL)(PQKBWorkID)10260528 035 $a(UkCvUL)(PQKB)11140436 035 $a(UkCvUL)(MiAaPQ)EBC168520 035 $a(UkCvUL)991000000000002452 035 $a(OCoLC)1027753151 035 $a(EXLCZ)991000000000002452 100 $a20180706d2014 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aElectron Microscopy and Analysis, Third Edition /$fPeter J. Goodhew, John Humphreys, Richard Beanland 205 $a3rd edition. 210 1$aBoca Raton, FL :$cCRC Press,$d2014. 215 $a1 online resource (262 p.) 300 $aDescription based upon print version of record. 311 0 $a1-138-44153-8 311 0 $a0-7484-0968-8 320 $aIncludes bibliographical references and index. 327 $aBook Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction 327 $aThe geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu 330 2 $a"Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook."--Provided by publisher. 606 $aElectron microscopy 615 0$aElectron microscopy. 676 $a502.825 676 $a502/.8/25 700 $aGoodhew$b Peter J.$0477169 702 $aBeanland$b Richard 702 $aHumphreys$b John 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910777360903321 996 $aElectron Microscopy and Analysis, Third Edition$93744703 997 $aUNINA