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101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aCharacterization of high Tc materials and devices by electron microscopy /$fedited by Nigel D. Browning, Stephen J. Pennycook$b[electronic resource]
210  1$aCambridge :$cCambridge University Press,$d2000.
215   $a1 online resource (xii, 391 pages) $cdigital, PDF file(s)
300   $aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
311   $a0-521-03170-2 
311   $a0-521-55490-X 
320   $aIncludes bibliographical references.
327   $g1.$tHigh-resolution transmission electron microscopy /$rS. Horiuchi and L. He --$g2.$tHolography in the transmission electron microscope /$rA. Tonomura --$g3.$tMicroanalysis by scanning transmission electron microscopy /$rL.M. Brown and J. Yuan --$g4.$tSpecimen preparation for transmission electron microscopy /$rJ.G. Wen --$g5.$tLow-temperature scanning electron microscopy /$rR.P. Huebener --$g6.$tScanning tunneling microscopy /$rM.E. Hawley --$g7.$tIdentification of new superconducting compounds by electron microscopy /$rG. Van Tendeloo and T. Krekels --$g8.$tValence band electron energy loss spectroscopy (EELS) of oxide superconductors /$rY.Y. Wang and V.P. Dravid.
330   $aThis is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
517 3 $aCharacterization of High Tc Materials & Devices by Electron Microscopy
606   $aHigh temperature superconductors
606   $aElectron microscopy$xTechnique
615  0$aHigh temperature superconductors.
615  0$aElectron microscopy$xTechnique.
676   $a537.6/23/0284
702   $aBrowning$b Nigel D.
702   $aPennycook$b Stephen J.
801  0$bUkCbUP
801  1$bUkCbUP
906   $aBOOK
912   $a9910777075803321
996   $aCharacterization of high Tc materials and devices by electron microscopy$9374367
997   $aUNINA