LEADER 03460nam 2200613 450 001 9910777033903321 005 20230125204623.0 010 $a1-58053-710-3 035 $a(CKB)1000000000411870 035 $a(EBL)338742 035 $a(OCoLC)437208186 035 $a(SSID)ssj0000097824 035 $a(PQKBManifestationID)11127412 035 $a(PQKBTitleCode)TC0000097824 035 $a(PQKBWorkID)10120781 035 $a(PQKB)11289708 035 $a(Au-PeEL)EBL338742 035 $a(CaPaEBR)ebr10221935 035 $a(CaBNVSL)mat09101170 035 $a(IEEE)9101170 035 $a(MiAaPQ)EBC338742 035 $a(EXLCZ)991000000000411870 100 $a20200729d2006 uy 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAdvanced production testing of RF, SoC, and SiP devices /$fJoe Kelly, Michael Engelhardt 210 1$aBoston :$cArtech House,$dİ2007. 210 2$a[Piscataqay, New Jersey] :$cIEEE Xplore,$d[2006] 215 $a1 online resource (325 p.) 225 1 $aArtech House microwave library 300 $aDescription based upon print version of record. 311 $a1-58053-709-X 320 $aIncludes bibliographical references and index. 327 $aAdvanced Production Testing of RF, SoC, and SiP Devices; Contents vii; Preface xvii; Acknowledgments xix; 1 Concepts of Production Testing of RF, SoC, and SiP Devices 1; 2 Tests and Measurements I: Fundamental RF Measurements; 3 Tests and Measurements II: Distortion 35; 4 Tests and Measurements III: Noise 59; 5 Advances in Testing RF and SoC Devices 97; 6 Production Test Equipment; 7 Cost of Test 139; 8 Calibration 159; 9 Contactors 175; 10 Handlers 201; 11 Load Boards 221; 12 Wafer Probing 253; Appendix A Power and Voltage Conversions 265 327 $aAppendix B VSWR, Return Loss, and Reflection Coefficient 271Appendix C RF Coaxial Cables 275; Appendix D RF Connectors 277; Appendix E Decimal to Hexadecimal and ASCII Conversions 283; Appendix F Numerical Prefixes 287; About the Authors 289; Index 291 330 3 $aFeaturing invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.$cPublisher abstract. 410 0$aArtech House microwave library. 606 $aSystems on a chip$xTesting 606 $aEmbedded computer systems 615 0$aSystems on a chip$xTesting. 615 0$aEmbedded computer systems. 676 $a621.3815 700 $aKelly$b Joe$cPh. D.$01527500 701 $aEngelhardt$b M$g(Michael)$01554699 801 0$bCaBNVSL 801 1$bCaBNVSL 801 2$bCaBNVSL 906 $aBOOK 912 $a9910777033903321 996 $aAdvanced production testing of RF, SoC, and SiP devices$93816099 997 $aUNINA