LEADER 03961nam 22006855 450 001 9910768477403321 005 20231128045658.0 010 $a3-031-48711-7 024 7 $a10.1007/978-3-031-48711-8 035 $a(MiAaPQ)EBC30975874 035 $a(Au-PeEL)EBL30975874 035 $a(DE-He213)978-3-031-48711-8 035 $a(EXLCZ)9929089603600041 100 $a20231128d2024 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aProceedings of SIE 2023$b[electronic resource] $e54th Annual Meeting of the Italian Electronics Society /$fedited by Carmine Ciofi, Ernesto Limiti 205 $a1st ed. 2024. 210 1$aCham :$cSpringer Nature Switzerland :$cImprint: Springer,$d2024. 215 $a1 online resource (469 pages) 225 1 $aLecture Notes in Electrical Engineering,$x1876-1119 ;$v1113 311 08$aPrint version: Ciofi, Carmine Proceedings of SIE 2023 Cham : Springer,c2024 327 $aA Binary Pattern Matching Task Performed in an EPCM-based Analog In-memory Computing Unit.-Carry-chain Based Ring Oscillator for FPGA: Design and Characterization -- Design and Analysis of a Voltage Schmitt Trigger in 4H-SIC CMOS Technology -- Nonlinear Adaptive Biasing for Low-voltage Class-AB OTAS -- An Ultra Low Voltage Physical Unclonable Function Exploiting Body-driven Feedback -- Accelerating Quantized DNN Layers on RISC-V with a STAR MAC Unit -- Design of a 1st-order Continuous-time Sigma-delta Modulator with a Digital-based Floating-inverter Integrator -- Towards Analog Neural Networks Integrated in Detectors Readout -- Printable Thermoelectric Device for Low Temperature Energy Harvesting -- Validation of Thermometer-based Techniques to Experimentally Extract the Impact of Nonlinear Thermal Effects on the Thermal Resistance of Bipolar Transistors -- Characterization of Discrete PIN Diode for TR Limiter Design at X-band -- Multibias TCAD Analysis of Trap Dynamics in GaN HEMTs -- Exploiting Millimeter-wave Radars to Enable Accurate Gesture Recognition for the Metaverse Environment -- A Ka-band Ultra-low Power GAAS MMIC LNA -- Key-components for Ultra-low DC Power Gallium Nitride Low-noise Receivers. 330 $aThis book showcases the state of the art in the field of electronics, as presented by researchers and engineers at the 54th Annual Meeting of the Italian Electronics Society (SIE), held in Noto (SR), Italy, on September 6?8, 2023. It covers a broad range of aspects, including: integrated circuits and systems, micro- and nano-electronic devices, microwave electronics, sensors and microsystems, optoelectronics and photonics, power electronics, electronic systems and applications. 410 0$aLecture Notes in Electrical Engineering,$x1876-1119 ;$v1113 606 $aElectronic circuits 606 $aElectronics 606 $aMaterials 606 $aDetectors 606 $aOptoelectronic devices 606 $aSolid state physics 606 $aElectronic Circuits and Systems 606 $aElectronics and Microelectronics, Instrumentation 606 $aSensors and biosensors 606 $aOptoelectronic Devices 606 $aElectronic Devices 615 0$aElectronic circuits. 615 0$aElectronics. 615 0$aMaterials. 615 0$aDetectors. 615 0$aOptoelectronic devices. 615 0$aSolid state physics. 615 14$aElectronic Circuits and Systems. 615 24$aElectronics and Microelectronics, Instrumentation. 615 24$aSensors and biosensors. 615 24$aOptoelectronic Devices. 615 24$aElectronic Devices. 676 $a621.3815 700 $aCiofi$b Carmine$01457383 701 $aLimiti$b Ernesto$0985767 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910768477403321 996 $aProceedings of SIE 2023$93657919 997 $aUNINA