LEADER 03252nam 22006255 450 001 9910744501703321 005 20230908152518.0 010 $a3-031-41093-9 024 7 $a10.1007/978-3-031-41093-2 035 $a(MiAaPQ)EBC30736574 035 $a(Au-PeEL)EBL30736574 035 $a(DE-He213)978-3-031-41093-2 035 $a(PPN)27273649X 035 $a(CKB)28172715300041 035 $a(EXLCZ)9928172715300041 100 $a20230908d2023 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aPositron Profilometry $eProbing Material Depths for Enhanced Understanding /$fby Jerzy Dryzek 205 $a1st ed. 2023. 210 1$aCham :$cSpringer Nature Switzerland :$cImprint: Springer,$d2023. 215 $a1 online resource (146 pages) 225 1 $aSpringerBriefs in Materials,$x2192-1105 311 08$aPrint version: Dryzek, Jerzy Positron Profilometry Cham : Springer,c2023 9783031410925 327 $aIntroduction -- Positron Annihilation Techniques -- Fate of Energetic Positrons in Matter -- Positron Implantation Profile -- Positron in Inhomogeneous Matter. 330 $aThis book provides a comprehensive overview of positron profilometry, specifically focusing on the analysis of defect depth distribution in materials. Positron profilometry plays a crucial role in understanding and characterizing defects in a wide range of materials, including metals, semiconductors, polymers, and ceramics. By analyzing the depth distribution of defects, researchers can gain insights into various material properties, such as crystal structure, defect density, and diffusion behavior. The author's extensive research spanning a period of two decades has primarily centered on subsurface zones. These regions, located beneath the surface and subjected to various surface processes, play a crucial role in generating defect distributions. Three experimental techniques and their data analysis are described in detail: a variable-energy positron beam (VEP) called sometimes a slow positron beam, a technique called implantation profile depth scanning (DSIP), and a sequential etching (SET) technique. The usability of these techniques is illustrated by many examples of measurements by the author and others. 410 0$aSpringerBriefs in Materials,$x2192-1105 606 $aMaterials$xAnalysis 606 $aAntimatter 606 $aCondensed matter 606 $aBuilding materials 606 $aMaterials Characterization Technique 606 $aMatter-Antimatter Interactions 606 $aCondensed Matter Physics 606 $aStructural Materials 615 0$aMaterials$xAnalysis. 615 0$aAntimatter. 615 0$aCondensed matter. 615 0$aBuilding materials. 615 14$aMaterials Characterization Technique. 615 24$aMatter-Antimatter Interactions. 615 24$aCondensed Matter Physics. 615 24$aStructural Materials. 676 $a620.112 700 $aDryzek$b Jerzy$01432441 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910744501703321 996 $aPositron Profilometry$93577185 997 $aUNINA