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001 9910716960203321
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035   $a(CKB)5470000002526593
035   $a(OCoLC)761359415
035   $a(EXLCZ)995470000002526593
100   $a20111115j196711    ua             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAutomated data collection system applied to Hall effect and resistivity measurements /$fby Ralph D. Thomas
210  1$a[Washington, D.C.] :$cNational Aeronautics and Space Administration,$d[November 1967].
215   $a1 online resource (25 pages) $cillustrations
225 1 $aNASA/TM ;$vX-1464
320   $aIncludes bibliographical references (page 25).
606   $aElectrical resistivity$2nasat
606   $aHall effect$2nasat
606   $aSemiconductor devices$2nasat
606   $aTransport properties$2nasat
606   $aCadmium sulfides$2nasat
606   $aCryogenic equipment$2nasat
606   $aData acquisition$2nasat
606   $aThin films$2nasat
615  7$aElectrical resistivity.
615  7$aHall effect.
615  7$aSemiconductor devices.
615  7$aTransport properties.
615  7$aCadmium sulfides.
615  7$aCryogenic equipment.
615  7$aData acquisition.
615  7$aThin films.
700   $aThomas$b Ralph D.$098558
712 02$aUnited States.$bNational Aeronautics and Space Administration,
801  0$bOCLCE
801  1$bOCLCE
801  2$bOCLCQ
801  2$bOCLCO
801  2$bOCLCQ
801  2$bGPO
906   $aBOOK
912   $a9910716960203321
996   $aAutomated data collection system applied to Hall effect and resistivity measurements$93537157
997   $aUNINA