LEADER 00971cam0-2200325---450- 001 990004885450403321 005 20081210121443.0 035 $a000488545 035 $aFED01000488545 035 $a(Aleph)000488545FED01 035 $a000488545 100 $a19990604d1943----km-y0itay50------ba 101 0 $arom 102 $aRO 105 $ay-------001yy 200 1 $a<>rumänische Sprache$eihr Wesen und ihre volkliche Prägung$fvon Sextil Pescariu$gaus dem rumänischen Übersetzt und bearbeitet von Heinrich Kuen 210 $aLeipzig$cHarrassowitz$d1943 215 $aXXXII, 612 p., 35 tav.$d25 cm 225 1 $aRumänische Bibliothek$v1 610 0 $aLingua romena 676 $a459 700 1$aPuscariu,$bSextil$0164748 702 1$aKuen,$bHeinrich 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990004885450403321 952 $a459 PUS 1$fFLFBC 959 $aFLFBC 996 $aRumänische Sprache$9520768 997 $aUNINA LEADER 01816oam 2200553 450 001 9910716960203321 005 20211108121337.0 035 $a(CKB)5470000002526593 035 $a(OCoLC)761359415 035 $a(EXLCZ)995470000002526593 100 $a20111115j196711 ua 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAutomated data collection system applied to Hall effect and resistivity measurements /$fby Ralph D. Thomas 210 1$a[Washington, D.C.] :$cNational Aeronautics and Space Administration,$d[November 1967]. 215 $a1 online resource (25 pages) $cillustrations 225 1 $aNASA/TM ;$vX-1464 320 $aIncludes bibliographical references (page 25). 606 $aElectrical resistivity$2nasat 606 $aHall effect$2nasat 606 $aSemiconductor devices$2nasat 606 $aTransport properties$2nasat 606 $aCadmium sulfides$2nasat 606 $aCryogenic equipment$2nasat 606 $aData acquisition$2nasat 606 $aThin films$2nasat 615 7$aElectrical resistivity. 615 7$aHall effect. 615 7$aSemiconductor devices. 615 7$aTransport properties. 615 7$aCadmium sulfides. 615 7$aCryogenic equipment. 615 7$aData acquisition. 615 7$aThin films. 700 $aThomas$b Ralph D.$098558 712 02$aUnited States.$bNational Aeronautics and Space Administration, 801 0$bOCLCE 801 1$bOCLCE 801 2$bOCLCQ 801 2$bOCLCO 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910716960203321 996 $aAutomated data collection system applied to Hall effect and resistivity measurements$93537157 997 $aUNINA