LEADER 01514oam 2200445 450 001 9910716941103321 005 20220118113446.0 035 $a(CKB)5470000002526786 035 $a(OCoLC)1285393743 035 $a(OCoLC)995470000002526786 035 $a(EXLCZ)995470000002526786 100 $a20211116j202110 ua 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aMicrowave photoelasticity $eexploiting multiple resonances to measure stress changes within yttria-partially-stabilized /$fSeth W. Waldstein and Peter J. Schemmel 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dOctober 2021. 215 $a1 online resource (12 pages) $ccolor illustrations 225 1 $aNASA/TM ;$v20210018297 300 $a"October 2021." 320 $aIncludes bibliographical references (page 12). 517 $aMicrowave photoelasticity 606 $aPhotoelasticity$2nasat 606 $aZirconium$2nasat 606 $aYttria-stabilized zirconia$2nasat 615 7$aPhotoelasticity. 615 7$aZirconium. 615 7$aYttria-stabilized zirconia. 700 $aWaldstein$b Seth W.$01390241 702 $aSchemmel$b Peter J. 712 02$aNASA Glenn Research Center, 801 0$bGPO 801 1$bGPO 801 2$bGPO 906 $aBOOK 912 $a9910716941103321 996 $aMicrowave photoelasticity$93442847 997 $aUNINA