LEADER 01461oam 2200433 450 001 9910716639603321 005 20210830110102.0 035 $a(CKB)5470000002523771 035 $a(OCoLC)1260302569 035 $a(OCoLC)995470000002523771 035 $a(EXLCZ)995470000002523771 100 $a20210716j202104 ua 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aTotal ionizing dose test report for the SFT2222A NPN bipolar junction transistor /$fDakai Chen, James Forney 210 1$aGreenbelt, Maryland :$cNational Aeronautics and Space Administration, Goddard Space Flight Center,$dApril 2021. 215 $a1 online resource (approximately 22 pages) $cillustrations 225 1 $aNASA/TM ;$v20210010530 300 $a"April 2021." 320 $aIncludes bibliographical references (page 5). 606 $aBipolar transistors$2nasat 606 $aJunction transistors$2nasat 615 7$aBipolar transistors. 615 7$aJunction transistors. 700 $aChen$b Dakai$f1982-$01414202 702 $aForney$b James 712 02$aGoddard Space Flight Center, 801 0$bGPO 801 1$bGPO 801 2$bOCLCO 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910716639603321 996 $aTotal ionizing dose test report for the SFT2222A NPN bipolar junction transistor$93512692 997 $aUNINA