LEADER 01861oam  2200553   450 
001 9910716065103321
005 20210511101607.0
035   $a(CKB)5470000002517453
035   $a(OCoLC)785280917$z(OCoLC)50850504$z(OCoLC)761125149
035   $a(EXLCZ)995470000002517453
100   $a20120408j196901    ua             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aError analysis of input-noise-temperature measurements of low-noise amplifiers /$fby Hans-Juergen C. Blume
210  1$aWashington, D.C. :$cNational Aeronautics and Space Administration,$dJanuary 1969.
215   $a1 online resource (38 pages) $cillustrations
225 1 $aNASA/TN ;$vD-4997
300   $a"January 1969."
320   $aIncludes bibliographical references (page 31).
606   $aAmplifiers$2nasat
606   $aError analysis$2nasat
606   $aAmplifiers (Electronics)$xNoise$xMeasurement$xMathematical models
606   $aError analysis (Mathematics)
606   $aError analysis (Mathematics)$2fast
615  7$aAmplifiers.
615  7$aError analysis.
615  0$aAmplifiers (Electronics)$xNoise$xMeasurement$xMathematical models.
615  0$aError analysis (Mathematics)
615  7$aError analysis (Mathematics)
700   $aBlume$b Hans-Juergen C.$01406896
712 02$aUnited States.$bNational Aeronautics and Space Administration,
801  0$bOCLCE
801  1$bOCLCE
801  2$bABC
801  2$bAD#
801  2$bOCLCQ
801  2$bOCLCO
801  2$bOCLCQ
801  2$bOCLCF
801  2$bOCLCQ
801  2$bCOP
801  2$bGPO
906   $aBOOK
912   $a9910716065103321
996   $aError analysis of input-noise-temperature measurements of low-noise amplifiers$93486924
997   $aUNINA