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001 9910716054103321
005 20210514110913.0
035   $a(CKB)5470000002517564
035   $a(OCoLC)785074313
035   $a(EXLCZ)995470000002517564
100   $a20120408j196903    ua             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aOn the resolution and image intensity of the field-ion microscope /$fby Victor G. Weizer and Americo F. Forestieri
210  1$aWashington, D.C. :$cNational Aeronautics and Space Administration,$dMarch 1969.
215   $a1 online resource (ii, 14 pages) $cillustrations
225 1 $aNASA/TN ;$vD-5125
300   $a"March 1969."
320   $aIncludes bibliographical references (pages 13-14).
606   $aMicroscopes$2nasat
606   $aPhotography$2nasat
606   $aField ion microscopes
606   $aImaging systems$xImage quality
606   $aField ion microscopes$2fast
606   $aImaging systems$xImage quality$2fast
615  7$aMicroscopes.
615  7$aPhotography.
615  0$aField ion microscopes.
615  0$aImaging systems$xImage quality.
615  7$aField ion microscopes.
615  7$aImaging systems$xImage quality.
700   $aWeizer$b Victor G.$01412505
702   $aForestieri$b Americo F.
712 02$aUnited States.$bNational Aeronautics and Space Administration,
801  0$bOCLCE
801  1$bOCLCE
801  2$bOCLCQ
801  2$bOCLCF
801  2$bOCLCQ
801  2$bCOP
801  2$bGPO
906   $aBOOK
912   $a9910716054103321
996   $aOn the resolution and image intensity of the field-ion microscope$93506213
997   $aUNINA