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101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aStress-strain behavior of cold-welded copper-copper microjunctions in vacuum as determined from electrical resistance measurements /$fby John S. Przybyszewski
210  1$aWashington, D.C. :$cNational Aeronautics and Space Administration,$dAugust 1968.
215   $a1 online resource (ii, 20 pages) $cillustrations
225 1 $aNASA technical note ;$vTN D-4743
300   $a"August 1968."
320   $aIncludes bibliographical references (pages 19-20).
606   $aStress-strain curves
606   $aCold welding
606   $aCold welding$2fast
606   $aStress-strain curves$2fast
615  0$aStress-strain curves.
615  0$aCold welding.
615  7$aCold welding.
615  7$aStress-strain curves.
700   $aPrzybyszewski$b John S.$01421790
712 02$aUnited States.$bNational Aeronautics and Space Administration,
712 02$aLewis Research Center.
801  0$bOCLCE
801  1$bOCLCE
801  2$bOCLCQ
801  2$bOCLCF
801  2$bOCLCQ
801  2$bOCLCO
801  2$bOCLCQ
801  2$bGPO
906   $aBOOK
912   $a9910715023203321
996   $aStress-strain behavior of cold-welded copper-copper microjunctions in vacuum as determined from electrical resistance measurements$93544028
997   $aUNINA