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100   $a20160121d2002      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aPhase composition analysis of the NIST reference clinkers by optical microscopy and X-ray powder diffraction /$fPaul E. Stutzman, Stefan Leigh
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2002.
215   $a1 online resource
225 1 $aNIST technical note ;$v1441
300   $a2002.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aStutzman$b Paul E$01392797
701   $aLeigh$b Stefan$01392633
701   $aStutzman$b Paul E$01392797
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910714144703321
996   $aPhase composition analysis of the NIST reference clinkers by optical microscopy and X-ray powder diffraction$93487136
997   $aUNINA