LEADER 01461nam  2200421I  450 
001 9910713926903321
005 20201211082533.0
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035   $a(OCoLC)1201195769
035   $a(EXLCZ)995470000002506396
100   $a20201021j202009    ua             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aFar-infrared dielectric functions $esilicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si) /$fGiuseppe Cataldo, Edward J. Wollack
210  1$aGreenbelt, MD :$cNational Aeronautics and Space Administration, Goddard Space Flight Center,$dSeptember 2020.
215   $a1 online resource (26 pages) $ccolor illustration
225 1 $aNASA/TM ;$v20205007162
300   $a"September 2020."
320   $aIncludes bibliographical references (page 2).
517   $aFar-infrared dielectric functions 
606   $aNumerical analysis$2nasat
606   $aDielectric properties$2nasat
606   $aDielectrics$2nasat
615  7$aNumerical analysis.
615  7$aDielectric properties.
615  7$aDielectrics.
700   $aCataldo$b Giuseppe$01421693
702   $aWollack$b Edward J.
712 02$aGoddard Space Flight Center,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910713926903321
996   $aFar-infrared dielectric functions$93543703
997   $aUNINA