LEADER 01960oam  2200577Kn 450 
001 9910712920003321
005 20180920060538.3
024 8 $aGOVPUB-C13-ec27e7def6e3a080a94f6189dec5c769
035   $a(CKB)5470000002498996
035   $a(OCoLC)885061001$z(OCoLC)891554883
035   $a(OCoLC)995470000002498996
035   $a(EXLCZ)995470000002498996
100   $a20140730d1964      uas            0
101 0 $aeng
135   $aurbn||||||abp
135   $aurbn||||||ada
181   $ctxt$2rdacontent
182   $cn$2rdamedia
183   $anc$2rdacarrier
200 10$aEllipsometry in the measurement of surfaces and thin films$esymposium proceedings
210  1$aWashington :$cU.S. National Bureau of Standards,$d1964.
215   $a1 online resource (vi, 359 pages) $cillustrations
225 1 $aNational Bureau of Standards miscellaneous publication ;$v256
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aEdited by E. Passaglia, R.R. Strombery, and J. Kruger.
320   $aIncludes bibliographical references.
517   $aEllipsometry in the measurement of surfaces and thin films 
606   $aPolarization (Light)
606   $aSurfaces (Technology)
606   $aThin films
606   $aPolarization (Light)$2fast
606   $aSurfaces (Technology)$2fast
606   $aThin films$2fast
615  0$aPolarization (Light)
615  0$aSurfaces (Technology)
615  0$aThin films.
615  7$aPolarization (Light)
615  7$aSurfaces (Technology)
615  7$aThin films.
676   $a535.5
702   $aKruger$b Jerome
702   $aPassaglia$b Elio
702   $aStromberg$b R. R.
801  0$bOCLCE
801  1$bOCLCE
801  2$bOCLCQ
801  2$bOCLCO
906   $aBOOK
912   $a9910712920003321
996   $aEllipsometry in the measurement of surfaces and thin films$93441477
997   $aUNINA