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035   $a(OCoLC)995470000002486631
035   $a(EXLCZ)995470000002486631
100   $a20160707d1976      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAnalytical precision of one-sixth order semiquantitative spectrographic analysis /$fby J. M. Motooka and D. J. Grimes
210  1$a[Reston, Virginia] :$cUnited States Department of the Interior, Geological Survey,$d1976.
215   $a1 online resource (iii, 25 pages) $cillustrations
225 1 $aGeological Survey circular ;$v738
320   $aIncludes bibliographical references (page 4).
330   $a"Superimposed frequency diagrams represent precision for low, medium, and concentrations of 30 elements routinely determined by Denver-based mobile spectrographic laboratories."
606   $aOres$xSampling and estimation
606   $aSpectrum analysis
606   $aOres$xSampling and estimation$2fast
606   $aSpectrum analysis$2fast
615  0$aOres$xSampling and estimation.
615  0$aSpectrum analysis.
615  7$aOres$xSampling and estimation.
615  7$aSpectrum analysis.
700   $aMotooka$b J. M.$01396295
702   $aGrimes$b D. J$g(David J.),$f1943-
712 02$aGeological Survey (U.S.),
801  0$bCOP
801  1$bCOP
801  2$bOCLCO
801  2$bOCLCF
801  2$bOCLCA
801  2$bGPO
906   $aBOOK
912   $a9910711744103321
996   $aAnalytical precision of one-sixth order semiquantitative spectrographic analysis$93456126
997   $aUNINA