LEADER 02496oam 2200697 450 001 9910711741003321 005 20211027144820.0 035 $a(CKB)5470000002486663 035 $a(OCoLC)1081041853 035 $a(EXLCZ)995470000002486663 100 $a20190107d2018 ua 0 101 0 $aeng 135 $aurbn||||a|||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aSafeguarding trade secrets in the United States $ehearing before the Subcommittee on Courts, Intellectual Property, and the Internet of the Committee on the Judiciary, House of Representatives, One Hundred Fifteenth Congress, second session, April 17, 2018 210 1$aWashington :$cU.S. Government Publishing Office,$d2018. 215 $a1 online resource (iii, 19 pages) 300 $a"Serial no. 115-71." 517 $aSafeguarding trade secrets in the United States 606 $aTrade secrets$zUnited States 606 $aBusiness intelligence$zUnited States 606 $aConfidential business information 606 $aIntellectual property$xEconomic aspects$zUnited States 606 $aIntellectual property infringement$zUnited States$xPrevention 606 $aCompetition, International 606 $aBusiness intelligence$2fast 606 $aCompetition, International$2fast 606 $aConfidential business information$2fast 606 $aIntellectual property$xEconomic aspects$2fast 606 $aTrade secrets$2fast 607 $aUnited States$2fast 608 $aLegislative hearings.$2fast 608 $aOnline resources. 608 $aLegislative hearings.$2lcgft 615 0$aTrade secrets 615 0$aBusiness intelligence 615 0$aConfidential business information. 615 0$aIntellectual property$xEconomic aspects 615 0$aIntellectual property infringement$xPrevention. 615 0$aCompetition, International. 615 7$aBusiness intelligence. 615 7$aCompetition, International. 615 7$aConfidential business information. 615 7$aIntellectual property$xEconomic aspects. 615 7$aTrade secrets. 801 0$bGPO 801 1$bGPO 801 2$bOCLCF 801 2$bGPM 801 2$bMERUC 801 2$bGWC 801 2$bOCLCO 801 2$bGYG 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910711741003321 996 $aSafeguarding trade secrets in the United States$93435793 997 $aUNINA LEADER 03236oam 2200409zu 450 001 996206420303316 005 20210807001359.0 010 $a1-61284-656-4 035 $a(CKB)2670000000089109 035 $a(SSID)ssj0000669814 035 $a(PQKBManifestationID)12239459 035 $a(PQKBTitleCode)TC0000669814 035 $a(PQKBWorkID)10710581 035 $a(PQKB)10062307 035 $a(NjHacI)992670000000089109 035 $a(EXLCZ)992670000000089109 100 $a20160829d2011 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2011 IEEE 29th VLSI Test Symposium 210 31$a[Place of publication not identified]$cIEEE$d2011 215 $a1 online resource (328 pages) $cillustrations 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-61284-657-2 327 $aForeword -- Organizing Committee -- Program Committee -- Steering Committee -- Reviewers -- Acknowledgements -- Test Technology Technical Council (TTTC) -- Test Technology Educational Program (TTEP) Tutorials -- Awards -- Session 1 Session 1A: Post-Silicon Debug & Customer returns -- Session 1B: 3D ICS -- IP Session 1C: Test and Characterization of High-Speed Circuits -- Session 2 Session 2A: Power Issues in Test -- Session 2B: Analog, Mixed-Signal & RF Test/Diagnosis -- IP Session 2C: On Chip Parametric Sensors -- Session 3 Session 3A: Delay & Performance Test 1 -- Special Session 3B: Hot Topic: Multifaceted Approaches for Field Reliability -- IP Session 3C: Advanced Methods for Leveraging New Test Standards -- Session 4 Special Session 4A: New Topics -- Session 4B: Panel: Security -- IP Session 4C: The Buck Stops With Wafer Test: Dream Or Reality? -- Session 5 Special Session 5A: Apprentice, Season 4 -- Special Session 5B: Panel: How Much Toggle Activity Should We Be Testing With? -- Session 6 Session 6A: Delay & Performance Test 2 -- Session 6B: Memory Test and Repair -- IP Session 6C: The Bang For The Buck With Resiliency: Yield Or Field? -- Session 7 Session 7A: Low-Power IC Test -- Session 7B: On-line & System Testing -- Session 8 Session 8A: Aging, Transients & Soft Errors -- Special Session 8B: New Topic: Solar Cells -- Sessions 9 Special Session 9C: Panel: Coverage Closure in SoC Verification: Are We Chasing a Mirage? -- Session 10 Session 10A: Design for Testability 1 -- Session 10B: Error & Fault Tolerance 1 -- Session 11 Session 11A: Design for Testability 2 -- Session 11B: Error & Fault Tolerance 2 -- Session 12 Session 12A: ATPG & Compression -- Session 12B: Reducing Test & Diagnosis Costs -- Session 13 Special Session 13A: Practical Signal Processing at Mixed Signal Test Venues - Trend Removal, Noise Reduction, Wideband Signal Capturing -- Session 13B: Hot Topic: Smart Silicon -- Session 13C: Hot Topic: Design and Test of 3D and Emerging Memories. 606 $aIntegrated circuits$xVery large scale integration $xTesting$vCongresses 615 0$aIntegrated circuits$xVery large scale integration $xTesting 676 $a621 702 $aIEEE Staff 801 0$bPQKB 906 $aPROCEEDING 912 $a996206420303316 996 $a2011 IEEE 29th VLSI Test Symposium$92503857 997 $aUNISA