LEADER 00868nam0-2200241 --450 
001 9910471757503321
005 20230519105221.0
100   $a20210514d1919----kmuy0itay5050    ba
101 0 $aspa
102   $aES
105   $a        001yy
200 1 $aHistoria critica del reinado de don Alfonso XIII durante su menoridad bajo la regencia de su madre dona Maria Cristina de Austria$fpor Gabriel Maura Gamazo
210   $aBarcelona$cMontaner y Simon$d1919
215   $av.$d23 cm
700  1$aMaura Gamazo,$bGabriel$0192887
801  0$aIT$bUNINA$gREICAT$2UNIMARC
901   $aBK
912   $a9910471757503321
952   $aPA 65(1$b737$fFLFBC
952   $aPA 65(2$bS.I.$fFLFBC
959   $aFLFBC
996   $aHistoria critica del reinado de don Alfonso XIII durante su menoridad bajo la regencia de su madre dona Maria Cristina de Austria$93361460
997   $aUNINA

LEADER 01424aam  2200373I  450 
001 9910711391503321
005 20160205080659.0
024 8 $aGOVPUB-C13-58dd6aa06c405d42292b75d68350e343
035   $a(CKB)5470000002482112
035   $a(OCoLC)936670820
035   $a(EXLCZ)995470000002482112
100   $a20160205d1969      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMethods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969. /$fW. Murray Bullis
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1969.
215   $a1 online resource
225 1 $aNBS technical note ;$v495
300   $a1969.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aBullis$b W. Murray$01387657
701   $aBullis$b W. Murray$01387657
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711391503321
996   $aMethods of measurement for semiconductor materials, process control, and devices, quarterly report, April 1 to June 30, 1969$93547396
997   $aUNINA