LEADER 01637oam 2200457 450 001 9910705435503321 005 20141021121503.0 035 $a(CKB)5470000002451033 035 $a(OCoLC)881461940 035 $a(EXLCZ)995470000002451033 100 $a20140617d2014 ua 0 101 0 $aeng 135 $aurbn||||a|||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 14$aThe National Zoo of today and tomorrow $ean innovative center focused on the care and conservation of the world's species : hearing before the Committee on House Administration, House of Representatives, One Hundred Thirteenth Congress, second session, held in Washington, DC, April 2, 2014 210 1$aWashington :$cU.S. Government Printing Office,$d2014. 215 $a1 online resource (ii, 29 pages) 300 $aTitle from title screen (viewed on June 17, 2014). 300 $aPaper version available for sale by the Superintendent of Documents, U.S. Government Printing Office. 517 $aNational Zoo of today and tomorrow 606 $aWildlife research$zUnited States 606 $aManagement$2fast 606 $aWildlife research$2fast 607 $aUnited States$2fast 608 $aLegislative hearings.$2lcgft 615 0$aWildlife research 615 7$aManagement. 615 7$aWildlife research. 801 0$bGPO 801 1$bGPO 801 2$bGPO 801 2$bCOO 801 2$bOCLCO 801 2$bOCLCF 801 2$bGPO 906 $aBOOK 912 $a9910705435503321 996 $aThe National Zoo of today and tomorrow$93448698 997 $aUNINA LEADER 01480aam 2200385I 450 001 9910711389203321 005 20160205080659.0 024 8 $aGOVPUB-C13-5511943c6a8ae3a086b009b2864e60aa 035 $a(CKB)5470000002482135 035 $a(OCoLC)936670892 035 $a(EXLCZ)995470000002482135 100 $a20160205d1971 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMethods of measurement for semiconductor materials, process control, and devices $equarterly report January 1 to March 31, 1971 /$fW. Murray Bullis 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1971. 215 $a1 online resource 225 1 $aNBS technical note ;$v598 300 $a1971. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aMethods of measurement for semiconductor materials, process control, and devices 700 $aBullis$b W. Murray$01387657 701 $aBullis$b W. Murray$01387657 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910711389203321 996 $aMethods of measurement for semiconductor materials, process control, and devices$93437721 997 $aUNINA LEADER 01780nas 2200541- 450 001 9910875578503321 005 20230330000650.0 011 $a2682-4221 035 $a(CKB)5850000000022259 035 $a(CONSER)--2021343168 035 $a(DE-599)ZDB3117132-1 035 $a(EXLCZ)995850000000022259 100 $a20220104a20209999 --- - 101 0 $aara 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 03$aal-Majallah al-dawl?yah lil-fiqh wa-al-qa??? wa-al-tashr?? 210 1$a[Cairo, Egypt] :$cN?d? Qu??t Mi?r,$d2020- 215 $a1 online resource 300 $aTitle from title page. 311 08$aPrint version: al-Majallah al-dawl?yah lil-fiqh wa-al-qa??? wa-al-tashr??. (DLC) 2021343168 (OCoLC)1290720788 2682-4213 517 1 $aInternational journal of doctrine, judiciary, and legislation 517 1 $aIJDJL 606 $aLaw$zEgypt$vPeriodicals 606 $aLegislation$zEgypt$vPeriodicals 606 $aIslamic law$vPeriodicals 606 $aDroit$zÉgypte$vPériodiques 606 $aDroit islamique$vPériodiques 606 $aIslamic law$2fast$3(OCoLC)fst00979949 606 $aLaw$2fast$3(OCoLC)fst00993678 606 $aLegislation$2fast$3(OCoLC)fst00995636 607 $aEgypt$2fast 608 $aPeriodicals.$2fast 615 0$aLaw 615 0$aLegislation 615 0$aIslamic law 615 6$aDroit 615 6$aDroit islamique 615 7$aIslamic law. 615 7$aLaw. 615 7$aLegislation. 712 02$aN?d? al-Qu??h (Cairo, Egypt), 906 $aJOURNAL 912 $a9910875578503321 920 $aexl_impl conversion 996 $aAl-Majallah al-dawl?yah lil-fiqh wa-al-qa??? wa-al-tashr??$94193412 997 $aUNINA