LEADER 01357nam 2200337Ia 450 001 996384342403316 005 20200824132307.0 035 $a(CKB)1000000000595077 035 $a(EEBO)2248533887 035 $a(OCoLC)ocm23024568e 035 $a(OCoLC)23024568 035 $a(EXLCZ)991000000000595077 100 $a19910129d1631 uy | 101 0 $aeng 135 $aurbn||||a|bb| 200 10$aArticles to be enquired of, throughout the whole diocesse of Chichester$b[electronic resource] $eministred and giuen in charge to the church-wardens and sidemen within the same diocesse by the reuerend father in God Richard by Gods prouidence Bishop of Chichester, in his generall visitation holden anno Domini 1631 210 $aLondon $cPrinted by R.Y. for Thomas Bourne$dMDCXXXI [1631] 215 $a[16] p 300 $aSignatures: A-B⁴. 300 $aReproduction of original in the St. John's College (University of Cambridge). Library. 330 $aeebo-0203 606 $aVisitations, Ecclesiastical$zEngland 615 0$aVisitations, Ecclesiastical 701 $aMontagu$b Richard$f1577-1641.$01001493 801 0$bEBK 801 1$bEBK 801 2$bWaOLN 906 $aBOOK 912 $a996384342403316 996 $aArticles to be enquired of, throughout the whole Diocesse of Chichester$92365850 997 $aUNISA LEADER 01511aam 2200385I 450 001 9910711388703321 005 20160205080659.0 024 8 $aGOVPUB-C13-e752d4ef67b28f156b1ae5fafc9cba44 035 $a(CKB)5470000002482140 035 $a(OCoLC)936670962 035 $a(EXLCZ)995470000002482140 100 $a20160205d1972 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMethods of measurement for semiconductor materials, process control, and devices quarterly report $eApril 1 to June 30, 1972 /$fW. Murray Bullis 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1972. 215 $a1 online resource 225 1 $aNBS technical note ;$v743 300 $a1972. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aMethods of measurement for semiconductor materials, process control, and devices quarterly report 700 $aBullis$b W. Murray$01387657 701 $aBullis$b W. Murray$01387657 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910711388703321 996 $aMethods of measurement for semiconductor materials, process control, and devices quarterly report$93459274 997 $aUNINA