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035   $a(OCoLC)936670981
035   $a(EXLCZ)995470000002482145
100   $a20160205d1973      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMethods of measurement for semiconductor materials, process control, and devices quarterly report $eOctober 1 to December 31, 1972 /$fW. Murray Bullis
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1973.
215   $a1 online resource
225 1 $aNBS technical note ;$v773
300   $a1973.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aMethods of measurement for semiconductor materials, process control, and devices quarterly report 
700   $aBullis$b W. Murray$01387657
701   $aBullis$b W. Murray$01387657
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711388303321
996   $aMethods of measurement for semiconductor materials, process control, and devices quarterly report$93459274
997   $aUNINA