LEADER 00971nam0-2200313---450- 001 990008643600403321 005 20141121132418.0 035 $a000864360 035 $aFED01000864360 035 $a(Aleph)000864360FED01 035 $a000864360 100 $a20080407d1961----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $aa-------001yy 200 1 $aPavimenti marmorei fabbricazione di mattonelle$equalita e varieta nei marmi italiani, graniti e materiali analoghi, criteri d'impiego$fMario Pieri 205 $a2. ed ampl 210 $aMilano$cHoepli$d1961 215 $aXIV, 190 p., 8 c. di tav. a colori fuori testo$cill.$d25 cm 700 1$aPieri,$bMario$02414 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990008643600403321 952 $a113005$b455$fDCATA 952 $aU 9/10$b4630$fDINGE 959 $aDCATA 959 $aDINGE 996 $aPavimenti marmorei fabbricazione di mattonelle$9716268 997 $aUNINA LEADER 01511aam 2200385I 450 001 9910711388103321 005 20160205080659.0 024 8 $aGOVPUB-C13-b0081f7313a0d54b2e59347ce0809ebc 035 $a(CKB)5470000002482147 035 $a(OCoLC)936670992 035 $a(EXLCZ)995470000002482147 100 $a20160205d1973 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMethods of measurement for semiconductor materials, process control, and devices quarterly report $eApril 1 to June 30, 1973 /$fW. Murray Bullis 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1973. 215 $a1 online resource 225 1 $aNBS technical note ;$v806 300 $a1973. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aMethods of measurement for semiconductor materials, process control, and devices quarterly report 700 $aBullis$b W. Murray$01387657 701 $aBullis$b W. Murray$01387657 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910711388103321 996 $aMethods of measurement for semiconductor materials, process control, and devices quarterly report$93459274 997 $aUNINA