LEADER 01605nlm0 22004691i 450 
001 990009253910403321
010   $a9783540698128
035   $a000925391
035   $aFED01000925391
035   $a(Aleph)000925391FED01
035   $a000925391
100   $a20100926d2008----km-y0itay50------ba
101 0 $aeng
102   $aDE
135   $adrnn-008mamaa
200 1 $aImage Analysis and Recognition$bRisorsa elettronica$e5th International Conference, ICIAR 2008, Póvoa de Varzim, Portugal, June 25-27, 2008. Proceedings$fedited by Aurélio Campilho, Mohamed Kamel
210   $aBerlin ; Heidelberg$cSpringer$d2008
225 1 $aLecture Notes in Computer Science$x0302-9743$v5112
230   $aDocumento elettronico
336   $aTesto
337   $aFormato html, pdf
702  1$aCampilho,$bAurélio
702  1$aKamel,$bMohamed
801  0$aIT$bUNINA$gREICAT$2UNIMARC
856 4 $zFull text per gli utenti Federico II$uhttp://dx.doi.org/10.1007/978-3-540-69812-8
901   $aEB
912   $a990009253910403321
961   $aAlgorithm Analysis and Problem Complexity
961   $aArtificial intelligence
961   $aArtificial Intelligence (incl. Robotics)
961   $aBiometrics
961   $aBiometrics
961   $aComputer graphics
961   $aComputer Graphics
961   $aComputer Science
961   $aComputer software
961   $aComputer vision
961   $aImage Processing and Computer Vision
961   $aOptical pattern recognition
961   $aPattern Recognition
996   $aImage Analysis and Recognition$9772474
997   $aUNINA

LEADER 00829nam0-2200301---450-
001 990008656410403321
005 20080508102429.0
010   $a0-80-024261-8
035   $a000865641
035   $aFED01000865641
035   $a(Aleph)000865641FED01
035   $a000865641
100   $a20080508d1979----km-y0itay50------ba
101 0 $aeng
102   $aGB
105   $aa-------001yy
200 1 $aHydrology$ean advanced introduction to hydrological processes and modelling$fArved J. Raudkivi
210   $aOxford$cPergamon$d1979
215   $aIX, 479 p.$cill.$d24 cm
610 0 $aIdrologia
700  1$aRaudkivi,$bArved J.$015375
801  0$aIT$bUNINA$gRICA$2UNIMARC
901   $aBK
912   $a990008656410403321
952   $aGM1 M II 27$b65057$fGM1
959   $aGM1
996   $aHydrology$9715280
997   $aUNINA

LEADER 01600aam  2200421I  450 
001 9910711384503321
005 20160205080700.0
024 8 $aGOVPUB-C13-9aeac5136656f2c7d3ffc205876a5215
035   $a(CKB)5470000002482183
035   $a(OCoLC)936671138
035   $a(EXLCZ)995470000002482183
100   $a20160205d2002      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aTrapped ions and laser cooling, V $eselected publications of the Ion Storage Group of the NIST Time and Frequency Division /$fJames C. Bergquist, John J. Bollinger, Wayne M. Itano, David J. Wineland
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2002.
215   $a1 online resource
225 1 $aNIST technical note ;$v1524
300   $a2002.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aTrapped ions and laser cooling, V 
700   $aBergquist$b James Charles$01169688
701   $aBergquist$b James Charles$01169688
701   $aBollinger$b John J$01398158
701   $aItano$b Wayne M$01398159
701   $aWineland$b David J., editors$01398160
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711384503321
996   $aTrapped ions and laser cooling, V$93465651
997   $aUNINA