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005 20160205080700.0
024 8 $aGOVPUB-C13-9aeac5136656f2c7d3ffc205876a5215
035   $a(CKB)5470000002482183
035   $a(OCoLC)936671138
035   $a(EXLCZ)995470000002482183
100   $a20160205d2002      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aTrapped ions and laser cooling, V $eselected publications of the Ion Storage Group of the NIST Time and Frequency Division /$fJames C. Bergquist, John J. Bollinger, Wayne M. Itano, David J. Wineland
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2002.
215   $a1 online resource
225 1 $aNIST technical note ;$v1524
300   $a2002.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aTrapped ions and laser cooling, V 
700   $aBergquist$b James Charles$01169688
701   $aBergquist$b James Charles$01169688
701   $aBollinger$b John J$01398158
701   $aItano$b Wayne M$01398159
701   $aWineland$b David J., editors$01398160
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711384503321
996   $aTrapped ions and laser cooling, V$93465651
997   $aUNINA