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035   $a(CKB)5470000002481480
035   $a(OCoLC)869742569
035   $a(EXLCZ)995470000002481480
100   $a20140203d2014      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aEstimation of uncertainty in application profiles /$fDavid Flater
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2014.
215   $a1 online resource (40 pages) $cillustrations (some color)
225 1 $aNIST technical note ;$v1826
300   $a"January 2014."
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page (viewed February 3, 2013).
320   $aIncludes bibliographical references.
606   $aUncertainty
615  0$aUncertainty.
700   $aFlater$b David$01387951
701   $aFlater$b David$01387951
712 02$aPhysical Measurement Laboratory (National Institute of Standards and Technology (U.S.))
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711254103321
996   $aEstimation of uncertainty in application profiles$93535784
997   $aUNINA