LEADER 01603aam  2200421I  450 
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024 8 $aGOVPUB-C13-c0870828e04c8f294d89abdcdf27cdc3
035   $a(CKB)5470000002481495
035   $a(OCoLC)894517798
035   $a(EXLCZ)995470000002481495
100   $a20141105d2014      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aScreening for factors affecting application performance in profiling measurements /$fDavid Flater
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2014.
215   $a1 online resource (32 pages) $cillustrations (some color)
225 1 $aNIST technical note ;$v1855
300   $a"October 2014."
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page (viewed October 29, 2014).
320   $aIncludes bibliographical references.
606   $aComputer science
606   $aData integrity
615  0$aComputer science.
615  0$aData integrity.
700   $aFlater$b David$01387951
701   $aFlater$b David$01387951
712 02$aInformation Technology Laboratory (National Institute of Standards and Technology).$bSoftware and Systems Division.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711252603321
996   $aScreening for factors affecting application performance in profiling measurements$93441812
997   $aUNINA