LEADER 01627aam  2200469I  450 
001 9910711241303321
005 20151113033656.0
024 8 $aGOVPUB-C13-c6401a8ba130f3f9f502fdc421b3b08c
035   $a(CKB)5470000002481609
035   $a(OCoLC)929061499
035   $a(EXLCZ)995470000002481609
100   $a20151113d1969      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA Fortran program for analysis of ellipsometer measurements /$fFrank L. McCrackin
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1969.
215   $a1 online resource
225 1 $aNBS technical note ;$v479
300   $a1969.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
606   $aComputer programming
606   $aEllipsometry
606   $aFORTRAN (Computer program language)
606   $aPolarization (Light)
615  0$aComputer programming.
615  0$aEllipsometry.
615  0$aFORTRAN (Computer program language)
615  0$aPolarization (Light)
700   $aMcCrackin$b F. L$g(Frank L.)$01386933
701   $aMcCrackin$b F. L$g(Frank L.)$01386933
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711241303321
996   $aA Fortran program for analysis of ellipsometer measurements$93508890
997   $aUNINA