LEADER 01644aam  2200445I  450 
001 9910711230303321
005 20151113033702.0
024 8 $aGOVPUB-C13-8bb784b17be3edabf607e0237e924529
035   $a(CKB)5470000002481720
035   $a(OCoLC)929065890
035   $a(EXLCZ)995470000002481720
100   $a20151113d1984      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aSmall aperture analysis of the dual TEM cell and an investigation of test object scattering in a single TEM cell /$fPerry F. Wilson
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1984.
215   $a1 online resource
225 1 $aNBS technical note ;$v1076
300   $a1984.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
606   $aElectromagnetic fields
606   $aPerturbation (Quantum dynamics)
606   $aScattering (Physics)
615  0$aElectromagnetic fields.
615  0$aPerturbation (Quantum dynamics)
615  0$aScattering (Physics)
700   $aWilson$b Perry F$01392178
701   $aWilson$b Perry F$01392178
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711230303321
996   $aSmall aperture analysis of the dual TEM cell and an investigation of test object scattering in a single TEM cell$93446576
997   $aUNINA