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035   $a(OCoLC)929067056
035   $a(EXLCZ)995470000002481870
100   $a20151113d1990      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aNIST x-ray photoelectron spectroscopy (XPS) database /$fC. D. Wagner
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1990.
215   $a1 online resource
225 1 $aNIST technical note ;$v1289
300   $a1990.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aNIST x-ray photoelectron spectroscopy 
606   $aElectron spectroscopy
606   $aPhotoelectron spectroscopy
606   $aX-ray spectroscopy
615  0$aElectron spectroscopy.
615  0$aPhotoelectron spectroscopy.
615  0$aX-ray spectroscopy.
700   $aWagner$b C. D$01417940
701   $aWagner$b C. D$01417940
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711215503321
996   $aNIST x-ray photoelectron spectroscopy (XPS) database$93527803
997   $aUNINA