LEADER 01242aam  2200373I  450 
001 9910711215103321
005 20151113033704.0
024 8 $aGOVPUB-C13-1a0a02ad9f959b4e38a16f6b210d870c
035   $a(CKB)5470000002481874
035   $a(OCoLC)929067121
035   $a(EXLCZ)995470000002481874
100   $a20151113d1992      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aTwo-fluid measurements on thin films /$fFrederick I. Mopsik
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1992.
215   $a1 online resource
225 1 $aNIST technical note ;$v1294
300   $a1992.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aMopsik$b F. I$01402055
701   $aMopsik$b F. I$01402055
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711215103321
996   $aTwo-fluid measurements on thin films$93508879
997   $aUNINA