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035   $a(OCoLC)929067526
035   $a(EXLCZ)995470000002481947
100   $a20151113d1996      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aDielectric measurements using a reentrant cavity $emode-Matching analysis James Baker-Jarvis, Bill F. Riddle /$fJames Baker-Jarvis, Bill Riddle
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1996.
215   $a1 online resource
225 1 $aNIST technical note ;$v1384
300   $a1996.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aDielectric measurements using a reentrant cavity 
606   $aDielectric measurements
615  0$aDielectric measurements.
700   $aBaker-Jarvis$b James$01393083
701   $aBaker-Jarvis$b James$01393083
701   $aRiddle$b Bill$01401500
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711207903321
996   $aDielectric measurements using a reentrant cavity$93494460
997   $aUNINA