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100   $a20160121d2010      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 14$aThe second static analysis tool exposition (SATE) 2009 /$fvadim Okun, Aurelien Delaitre, Paul E. Black
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2010.
215   $a1 online resource
225 1 $aNIST special publication ;$v500-287
300   $a2010.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aSecond static analysis tool exposition 
700   $aOkun$b Vadim$01394648
701   $aBlack$b Paul E$019154
701   $aDelaitre$b Aure?lien$01401372
701   $aOkun$b Vadim$01394648
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910711175203321
996   $aThe second static analysis tool exposition (SATE) 2009$93504748
997   $aUNINA