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035   $a(CKB)5470000002480522
035   $a(OCoLC)957470713
035   $a(OCoLC)995470000002480522
035   $a(EXLCZ)995470000002480522
100   $a20160829d1962      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aThermal conductivity of semiconductive solids $emethod for steady-state measurements on small disk reference samples technical progress report for period October 1 to December 31, 1961 /$fD.R. Flynn
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1962.
215   $a1 online resource
225 1 $aNBS report ;$v7466
300   $a1962.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aThermal conductivity of semiconductive solids 
606   $aSolids$xThermal conductivity
615  0$aSolids$xThermal conductivity.
700   $aFlynn$b Daniel R$01387967
701   $aFlynn$b Daniel R$01387967
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bOCLCO
801  2$bOCLCQ
906   $aBOOK
912   $a9910711148903321
996   $aThermal conductivity of semiconductive solids$93439703
997   $aUNINA