LEADER 01648nam  2200481Ia 450 
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005 20180711120954.0
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035   $a(CKB)5470000002480865
035   $a(OCoLC)959982410
035   $a(OCoLC)995470000002480865
035   $a(EXLCZ)995470000002480865
100   $a20161006d1962      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe application of x-ray projection microscopy to roofing asphalt systems /$fSidney H. Greenfeld
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1962.
215   $a1 online resource
225 1 $aNBS report ;$v7589
300   $a1962.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
606   $aAsphalt$xTesting
606   $aX-ray microscopes$xTesting
606   $aAsphalt$xTesting$2fast
615  0$aAsphalt$xTesting.
615  0$aX-ray microscopes$xTesting.
615  7$aAsphalt$xTesting.
700   $aGreenfeld$b Sidney H$01387658
701   $aGreenfeld$b Sidney H$01387658
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bOCLCO
801  2$bOCLCQ
801  2$bOCLCF
906   $aBOOK
912   $a9910711115003321
996   $aThe application of x-ray projection microscopy to roofing asphalt systems$93508761
997   $aUNINA