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001 9910710782203321
005 20121108042819.0
024 8 $aGOVPUB-C13-4004d207ab56d721e6726dd0c95d9c89
035   $a(CKB)5470000002478482
035   $a(OCoLC)816519334
035   $a(EXLCZ)995470000002478482
100   $a20121108d2012      ua             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aCorrection factors for the NIST free-air ionization chambers used to realize air kerma from w-anode x-ray beams /$fStephen M. Seltzer
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2012.
215   $a1 online resource (41 pages) $cillustrations, tables
225 1 $aNISTIR ;$v7887
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aOctober 2012.
320   $aIncludes bibliographical references (pages 9-10).
606   $aIonization chambers$xCalibration
606   $aIonizing radiation$xStandards
606   $aPhoton emission
615  0$aIonization chambers$xCalibration.
615  0$aIonizing radiation$xStandards.
615  0$aPhoton emission.
700   $aSeltzer$b Stephen M$01390688
701   $aSeltzer$b Stephen M$01390688
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710782203321
996   $aCorrection factors for the NIST free-air ionization chambers used to realize air kerma from w-anode x-ray beams$93481292
997   $aUNINA