LEADER 01302aam  2200385I  450 
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005 20160421112332.0
024 8 $aGOVPUB-C13-5cd592a4808f4de7d7a522d02b389f00
035   $a(CKB)5470000002478551
035   $a(OCoLC)947047580
035   $a(EXLCZ)995470000002478551
100   $a20160421d2004      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMetric mapping concepts for TIA /$fMichelle Potts Steves; Jean Scholtz
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2004.
215   $a1 online resource
225 1 $aNISTIR ;$v7061
300   $a2004.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aSteves$b Michelle Potts$01389041
701   $aScholtz$b Jean$0882266
701   $aSteves$b Michelle Potts$01389041
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710775403321
996   $aMetric mapping concepts for TIA$93499844
997   $aUNINA