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035   $a(EXLCZ)995470000002478732
100   $a20160421d2007      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aQuality summarization $erecommendations on biometric quality summarization across the application domain /$fElham Tabassi; Patrick Grother
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2007.
215   $a1 online resource
225 1 $aNISTIR ;$v7422
300   $a2007.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aQuality summarization 
700   $aTabassi$b Elham$01387959
701   $aGrother$b Patrick J$01385097
701   $aTabassi$b Elham$01387959
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710757403321
996   $aQuality summarization$93466758
997   $aUNINA